Low-frequency noise measurements as an investigation tool of pixel flickering in cooled Hg0.7Cd0.3Te focal plane arrays

• Published in: IEEE transactions on electron devices Vol. 52; no. 5; pp. 928 - 933
• Main Authors: PEREZ, Jean-Philippe, MYARA, Mikhael, ALABEDRA, Robert, ORSAL, Bernard, LEYRIS, Cédric, TOURRENC, Jean-Philippe, SIGNORET, Philippe
• Format: Journal Article
• Language: English
• Published: New York, NY Institute of Electrical and Electronics Engineers 01-05-2005; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Applied sciences; Bolometer; infrared, submillimeter wave, microwave and radiowave receivers and detectors; Electronics; Exact sciences and technology; General equipment and techniques; Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Optoelectronic devices; Physics; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing; Focal plane arrays; Measurement sensor; Infrared detector; indium bump; 1/f noise; Semiconductor detector; Noise measurement; Photodetector; RTS; Electrical measurement; Detectivity; infrared photodetector; Noise source; Optoelectronic device; Illumination; HgCdTe; infrared complementary metal-oxyd semiconductor (IRCMOS); pixel
• ISSN: 0018-9383; 1557-9646
• DOI: 10.1109/TED.2005.846328