In situ synchrotron X-ray total scattering measurements and analysis of colloidal CsPbX 3 nanocrystals during flow synthesis

• Published in: Journal of synchrotron radiation Vol. 30; no. Pt 6; pp. 1092 - 1099
• Main Authors: Greenberg, Matthew W, Lin, Cheng Hung, Chodankar, Shirish, Ghose, Sanjit K
• Format: Journal Article
• Language: English
• Published: United States International Union of Crystallography 01-11-2023
• Subjects: Research Papers; perovskites; nucleation; pair distribution function; small-angle X-ray scattering; nanocrystals; X-ray total scattering
• ISSN: 0909-0495; 1600-5775
• DOI: 10.1107/s1600577523007300

In situ X-ray scattering measurements of CsPbX
(X = Cl, Br, I) nanocrystal formation and halide exchange at NSLS-II beamlines were performed in an automated flow reactor. Total scattering measurements were performed at the 28-ID-2 (XPD) beamline and small-angle X-ray scattering at the 16-ID (LiX) beamline. Nanocrystal structural parameters of interest, including size, size distribution and atomic structure, were extracted from modeling the total scattering data. The results highlight the potential of these beamlines and the measurement protocols described in this study for studying dynamic processes of colloidal nanocrystal synthesis in solution with timescales on the order of seconds.