Resonant Inelastic X-Ray Scattering Study of Electron-Exciton Coupling in High-Tc Cuprates
Explaining the mechanism of superconductivity in the high-Tccuprates requires an understanding of what causes electrons to form Cooper pairs. Pairing can be mediated by phonons, the screened Coulomb force, spin or charge fluctuations, excitons, or by a combination of these. An excitonic pairing mech...
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Published in: | Physical review. X Vol. 12; no. 2 |
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Main Authors: | , , , , , , , , , , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
College Park
American Physical Society
29-06-2022
American Physical Society (APS) |
Subjects: | |
Online Access: | Get full text |
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Summary: | Explaining the mechanism of superconductivity in the high-Tccuprates requires an understanding of what causes electrons to form Cooper pairs. Pairing can be mediated by phonons, the screened Coulomb force, spin or charge fluctuations, excitons, or by a combination of these. An excitonic pairing mechanism has been postulated, but experimental evidence for coupling between conduction electrons and excitons in the cuprates is sporadic. Here we use resonant inelastic x-ray scattering to monitor the temperature dependence of thed_dexciton spectrum ofBi2Sr2CaCu2O8−xcrystals with different charge carrier concentrations. We observe a significant change of thed_dexciton spectra when the materials pass from the normal state into the superconductor state. Our observations show that thed_dexcitons start to shift up (down) in the overdoped (underdoped) sample when the material enters the superconducting phase. We attribute the superconductivity-induced effect and its sign reversal from underdoped to overdoped to the exchange coupling of the site of thed_dexciton to the surrounding copper spins. |
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Bibliography: | European Union (EU) USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division Swiss National Science Foundation (SNSF) AC02-76SF00515; SC0012704; 179157; 178867; 160765; 701647 |
ISSN: | 2160-3308 2160-3308 |
DOI: | 10.1103/PhysRevX.12.021068 |