Some common aspects of design validation, debug and diagnosis

Some common aspects of design validation, debug and diagnosis

Design, verification and test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnostic resolution. In this paper, an overview is given on the common aspects of these tasks and how they interact. Diagnosis tech...

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Bibliographic Details
Published in:Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) pp. 6 pp. - 10
Main Authors: Arnaout, T., Bartsch, G., Wunderlich, H.J.
Format: Conference Proceeding
Language:English
Published: IEEE 2006
Subjects:
Circuit faults
Circuit testing
Electrical fault detection
Emulation
Fault detection
Integrated circuit testing
Manufacturing
Performance evaluation
Prototypes
System testing
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Summary:Design, verification and test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnostic resolution. In this paper, an overview is given on the common aspects of these tasks and how they interact. Diagnosis techniques may be used after manufacturing, for chip characterization and field return analysis, and even for rapid prototyping
ISBN:9780769525006
0769525008
DOI:10.1109/DELTA.2006.79