Electron beams in X-pinches

X-pinch radiation produced by electron beams accelerated in the X-pinch mini diode has been studied and used to image a variety of different objects. The experiments have been carried out using the XP pulser (470 kA, 100 ns) at Cornell University and the BIN pulser (280 kA, 120 ns) at the P.N. Lebed...

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Bibliographic Details
Published in:	2004 International Conference on High-Power Particle Beams (BEAMS 2004) pp. 806 - 809
Main Authors:	Shelkovenko, T. A., Pikuz, S. A., Ivanenkov, G. V., Mingaleev, A. R., Romanova, V. M., Ter-Oganesyan, A. E., Chandler, K. M., Mitchell, M. D., Hammer, D. A.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-07-2004
Subjects:	Biology Wires X-ray imaging
Online Access:	Get full text
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Summary:	X-pinch radiation produced by electron beams accelerated in the X-pinch mini diode has been studied and used to image a variety of different objects. The experiments have been carried out using the XP pulser (470 kA, 100 ns) at Cornell University and the BIN pulser (280 kA, 120 ns) at the P.N. Lebedev Physical Institute. This electron-beam-generated X-ray source's geometric, temporal and spectral properties have been studied over different energy ranges between 8 and 50 keV. The imaging was carried out in a low magnification scheme, and spatial resolution of a few tens of μm was demonstrated.
ISBN:	5879110885 9785879110883