In-situ Characterization Of Adsorbed Protein Films Using Surface Plasmon Resonance

In-situ Characterization Of Adsorbed Protein Films Using Surface Plasmon Resonance

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Bibliographic Details
Published in:[1990] Proceedings of the Twelfth Annual International Conference of the IEEE Engineering in Medicine and Biology Society pp. 440 - 442
Main Authors: Jorgenson, R.C., Yee, S.S., Chittur, K.K., Burgess, L.W.
Format: Conference Proceeding
Language:English
Published: IEEE 1990
Subjects:
Dielectric films
Dielectric thin films
Equations
Optical films
Optical reflection
Plasmons
Polymer films
Protein engineering
Refractive index
Resonance
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Description
ISBN:9780879425593
0879425598
DOI:10.1109/IEMBS.1990.691154