Integrated Simulation of Electrical and Thermal Processes in Optoelectronic Devices Designing

The article studies the mutual influence of electrical and thermal processes due to their simultaneous occurrence in the printed circuit assemblies of optoelectronic devices (OEDs) in real operating conditions. An increase in the accuracy of computer modeling of electrical and thermal processes can...

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Bibliographic Details

Published in:	2021 International Seminar on Electron Devices Design and Production (SED) pp. 1 - 4
Main Authors:	Kuznetsov, Evgenii V., Golyaev, Yury D., Zemlyanov, Michail M., Kofanov, Yury N., Kuznetsov, Nikita E., Sotnikova, Svetlana Y.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 27-04-2021
Subjects:	Computational modeling computer modelling digital twin Electric potential electrical processes electrothermal analogy Fault diagnosis integrated model laser gyroscopes Optoelectronic devices Printed circuits Thermal analysis Thermal engineering thermal processes
Online Access:	Get full text
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