An Active THevenin Equivalent Network Approach to EMI/EMC problems

Nonlinear responses of the semiconductor devices in electronic devices can change the impedances seen at the circuit nodes, changing the boundary conditions encountered by impressed electromagnetic fields and thus the field coupling. We have developed the Active THevenin Equivalent Network Approach...

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Published in:2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) pp. 878 - 881
Main Authors: Williams, Jeffery T., Bacon, Larry D., Walker, Michael J., Zeek, Erik C.
Format: Conference Proceeding
Language:English
Published: IEEE 01-08-2014
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Abstract Nonlinear responses of the semiconductor devices in electronic devices can change the impedances seen at the circuit nodes, changing the boundary conditions encountered by impressed electromagnetic fields and thus the field coupling. We have developed the Active THevenin Equivalent Network Approach (ATHENA), which allows us to include electromagnetic coupling in nonlinear circuit simulations in a bidirectional, fully consistent way. Including the coupling in the circuit simulation self-consistently is important because it allows us to predict responses to EMI/EMC both correctly and efficiently, opening the way to predicting response statistics.
AbstractList Nonlinear responses of the semiconductor devices in electronic devices can change the impedances seen at the circuit nodes, changing the boundary conditions encountered by impressed electromagnetic fields and thus the field coupling. We have developed the Active THevenin Equivalent Network Approach (ATHENA), which allows us to include electromagnetic coupling in nonlinear circuit simulations in a bidirectional, fully consistent way. Including the coupling in the circuit simulation self-consistently is important because it allows us to predict responses to EMI/EMC both correctly and efficiently, opening the way to predicting response statistics.
Author Williams, Jeffery T.
Walker, Michael J.
Zeek, Erik C.
Bacon, Larry D.
Author_xml – sequence: 1
  givenname: Jeffery T.
  surname: Williams
  fullname: Williams, Jeffery T.
  organization: Directed Energy Special Applic., Sandia Nat. Labs. Albuquerque, Albuquerque, NM, USA
– sequence: 2
  givenname: Larry D.
  surname: Bacon
  fullname: Bacon, Larry D.
  organization: Directed Energy Special Applic., Sandia Nat. Labs. Albuquerque, Albuquerque, NM, USA
– sequence: 3
  givenname: Michael J.
  surname: Walker
  fullname: Walker, Michael J.
  organization: Directed Energy Special Applic., Sandia Nat. Labs. Albuquerque, Albuquerque, NM, USA
– sequence: 4
  givenname: Erik C.
  surname: Zeek
  fullname: Zeek, Erik C.
  organization: Directed Energy Special Applic., Sandia Nat. Labs. Albuquerque, Albuquerque, NM, USA
BookMark eNo9kM1Og0AUhUetiW3tC-hmXgA6d35gZokELUmrC2viroHhTkQpINAa314Sq6uTnC_5cnJmZFI3NRJyA8wHYGaZPieb2OcMpB9oY5iBMzIDGRqjlBTynEw5KO0BgL4gCxPqPyb55J-x1yuy6Pt3xtjoDIyAKbmLahrZoTwi3a7wiHVZ0-TzUB6zCuuBPuLw1XQfNGrbrsnsGx0ammzS5biGjk1e4b6_Jpcuq3pcnHJOXu6Tbbzy1k8PaRytvZLLYPDyAI2QueAa0WpjrQqdlbkMWJgbVbDAFJkLnStUiAIUc5YVQmvFXWE1VyDm5PbXWyLiru3KfdZ97053iB-jX1BI
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/ISEMC.2014.6899091
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 1479955434
9781479955459
1479955450
9781479955435
EISSN 2158-1118
EndPage 881
ExternalDocumentID 6899091
Genre orig-research
GroupedDBID 6IE
6IF
6IH
6IK
6IL
6IM
6IN
AAJGR
ACGFS
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IJVOP
IPLJI
M43
OCL
RIE
RIL
RIO
RNS
ID FETCH-LOGICAL-i246t-b6e934b328eec89cc57fc4b4607b95d069daf7ffd57e3150fc0d38852fdc82513
IEDL.DBID RIE
ISBN 9781479955442
1479955442
ISSN 2158-110X
IngestDate Wed Jun 26 19:23:48 EDT 2024
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i246t-b6e934b328eec89cc57fc4b4607b95d069daf7ffd57e3150fc0d38852fdc82513
OpenAccessLink https://www.osti.gov/biblio/1140686
PageCount 4
ParticipantIDs ieee_primary_6899091
PublicationCentury 2000
PublicationDate 2014-Aug.
PublicationDateYYYYMMDD 2014-08-01
PublicationDate_xml – month: 08
  year: 2014
  text: 2014-Aug.
PublicationDecade 2010
PublicationTitle 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)
PublicationTitleAbbrev ISEMC
PublicationYear 2014
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0001096931
Score 1.9528813
Snippet Nonlinear responses of the semiconductor devices in electronic devices can change the impedances seen at the circuit nodes, changing the boundary conditions...
SourceID ieee
SourceType Publisher
StartPage 878
SubjectTerms Couplings
Impedance
Nonlinear circuits
Ports (Computers)
Resistors
Time-domain analysis
Title An Active THevenin Equivalent Network Approach to EMI/EMC problems
URI https://ieeexplore.ieee.org/document/6899091
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07b8IwELYKU7v0AVXf8tCxAcfxIx4pDaJDUSWoxIYSPySW0AL5_z07AVqpS7ckg2Pdxb7z5b7vQ-iROBPzPFFRbGA1MadFpJzwdSvIl4tckjz2aOTxVE7m6UvmaXKe9lgYa21oPrM9fxn-5ZuVrnyprC_gcEA8VL0lVVpjtQ71FBhbBflBCGJwMIrJPOC4POEZZ4zu6J129zsADVH912n2NvRdXqzXvOGX1EqINKPT_83xDHUPkD38vg9G5-jIlhfo5AfbYAc9D0o8CNsbno09cdOyxNlXtYRvDYbEk7ohHA8alnG8XWFwUh9mjRvZmU0XfYyy2XAcNRIK0ZIysY0KYVXCioSm1upUac2l06xggshCcUOEMrmTzhkubQK5odMEfJZy6oz2oNbkErXLVWmvEPYyxVxYJ5yFsJ7SnAlDqSfvgaQFEoVr1PHWWHzWLBmLxhA3fz--Rcfe4HUr3R1qb9eVvUetjakegl-_AQABmx8
link.rule.ids 310,311,782,786,791,792,798,27936,54770
linkProvider IEEE
linkToHtml http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT8JAEN4oHtSLDzC-3YNHC9t2H90jYkmJQEzAhBtp95FwKSr0_zvbFtDEi7e2h-1mprszO53v-xB6JFb7LA2l52tYTdQq7knLXd0K8uUsFST1HRo5mYjxLHqJHU3O0xYLY4wpm89M212W__L1UhWuVNbhcDggDqp-wKgQpEJr7SoqMLosBQghjMHRyCezEsnlKM8YpcGG4Glzv4HQENkZTOJRz_V50Xb9jl9iK2Ws6Z_8b5anqLUD7eG3bTg6Q3smP0fHP_gGm-i5m-NuucHhaeKomxY5jj-LBXxtMCQeVy3huFvzjOP1EoObOjBrXAvPrFrovR9Pe4lXiyh4i4DytZdxI0OahUFkjIqkUkxYRTPKicgk04RLnVphrWbChJAdWkXAaxELrFYO1hpeoEa-zM0lwk6omHFjuTUQ2KMgpVwHgaPvgbQFUoUr1HTWmH9UPBnz2hDXfz9-QIfJdDScDwfj1xt05IxfNdbdosb6qzB3aH-li_vSx99Zpp5q
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2014+IEEE+International+Symposium+on+Electromagnetic+Compatibility+%28EMC%29&rft.atitle=An+Active+THevenin+Equivalent+Network+Approach+to+EMI%2FEMC+problems&rft.au=Williams%2C+Jeffery+T.&rft.au=Bacon%2C+Larry+D.&rft.au=Walker%2C+Michael+J.&rft.au=Zeek%2C+Erik+C.&rft.date=2014-08-01&rft.pub=IEEE&rft.isbn=9781479955442&rft.issn=2158-110X&rft.eissn=2158-1118&rft.spage=878&rft.epage=881&rft_id=info:doi/10.1109%2FISEMC.2014.6899091&rft.externalDocID=6899091
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2158-110X&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2158-110X&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2158-110X&client=summon