Design of dynamic reliability indices

The multi-state system reliability is investigated in this paper. The new class of reliability indices is obtained. We have called these indices as dynamic reliability indices. These indices estimate influence upon the multi-state system reliability by the capacity levels of a system component. The...

Full description

Saved in:
Bibliographic Details
Published in:Proceedings - International Symposium on Multiple-Valued Logic pp. 144 - 148
Main Authors: Zaitseva, E.N., Levashenko, V.G.
Format: Conference Proceeding Journal Article
Language:English
Published: Los Alamitos CA IEEE 2002
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Abstract The multi-state system reliability is investigated in this paper. The new class of reliability indices is obtained. We have called these indices as dynamic reliability indices. These indices estimate influence upon the multi-state system reliability by the capacity levels of a system component. The multiple-valued logic mathematical tools are used for calculation of dynamic reliability indices.
AbstractList The Multi-State System reliability is investigated in this paper. The new class of Reliability Indices is obtained. We have called these indices as Dynamic Reliability Indices. These indices estimate influence upon the Multi-State System reliability by the capacity levels of a system component. The Multiple-Valued Logic mathematical tools are used for calculation of Dynamic Reliability Indices.
Author Zaitseva, E.N.
Levashenko, V.G.
Author_xml – sequence: 1
  givenname: E.N.
  surname: Zaitseva
  fullname: Zaitseva, E.N.
  organization: Dept. of Inf. Technol., Belarus State Economic Univ., Minsk, Belarus
– sequence: 2
  givenname: V.G.
  surname: Levashenko
  fullname: Levashenko, V.G.
  organization: Dept. of Inf. Technol., Belarus State Economic Univ., Minsk, Belarus
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=15812268$$DView record in Pascal Francis
BookMark eNpFkM1LAzEQxYNWsNb-A3rZS71tnSTdTPYo9atQ8eAH3pY0mUhkm62b9tD_3kALvss83vwYhnfBBrGLxNgVhynnUN8u3l4-l1MBIKYccqLFCRsKiboUQqhTNq5RA6q64jMl9IANgddVqYT8OmfjlH4ga1ZxRByyyT2l8B2LzhduH8062KKnNphVaMN2X4TogqV0yc68aRONj3PEPh4f3ufP5fL1aTG_W5ZByNm21N6jdisBiN7IbJwjy23-QipZgXJCcfIowHtpQBJxrhHJOJQWgKwcsZvD3U3f_e4obZt1SJba1kTqdqkRCDVIjRmcHEGTrGl9b6INqdn0YW36fcMrzXMVOnPXBy4Q0f_60Jr8AyPVXow
ContentType Conference Proceeding
Journal Article
Copyright 2004 INIST-CNRS
Copyright_xml – notice: 2004 INIST-CNRS
DBID 6IE
6IH
CBEJK
RIE
RIO
IQODW
7SC
8FD
JQ2
L7M
L~C
L~D
DOI 10.1109/ISMVL.2002.1011082
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP) 1998-present
Pascal-Francis
Computer and Information Systems Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle Computer and Information Systems Abstracts
Technology Research Database
Computer and Information Systems Abstracts – Academic
Advanced Technologies Database with Aerospace
ProQuest Computer Science Collection
Computer and Information Systems Abstracts Professional
DatabaseTitleList Computer and Information Systems Abstracts

Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Applied Sciences
Mathematics
EISSN 2378-2226
EndPage 148
ExternalDocumentID 15812268
1011082
GroupedDBID 6IE
6IH
6IK
6IL
AAJGR
AAVQY
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
OCL
RIB
RIC
RIE
RIL
RIO
--Z
-~X
23M
29O
6IF
6IM
6IN
ABLEC
ADZIZ
AFFNX
CHZPO
G8K
IEGSK
IJVOP
IPLJI
IQODW
JC5
M43
RIG
RNS
7SC
8FD
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-i234t-8ff78db2077fa3db2ddec1c462363506d261ef720ff3a03ee11877ead73c00ec3
IEDL.DBID RIE
ISBN 9780769514628
0769514626
ISSN 0195-623X
IngestDate Fri Aug 16 01:05:29 EDT 2024
Sun Oct 22 16:08:10 EDT 2023
Wed Jun 26 19:26:54 EDT 2024
IsPeerReviewed false
IsScholarly true
Keywords System reliability
Mathematical logic
Multivalued logic
Language English
License CC BY 4.0
LinkModel DirectLink
MeetingName 32nd IEEE international symposium on multiple-valued logic (Boston MA, 15-18 May 2002)
MergedId FETCHMERGED-LOGICAL-i234t-8ff78db2077fa3db2ddec1c462363506d261ef720ff3a03ee11877ead73c00ec3
Notes SourceType-Scholarly Journals-2
ObjectType-Feature-2
ObjectType-Conference Paper-1
content type line 23
SourceType-Conference Papers & Proceedings-1
ObjectType-Article-3
PQID 27090387
PQPubID 23500
PageCount 5
ParticipantIDs proquest_miscellaneous_27090387
ieee_primary_1011082
pascalfrancis_primary_15812268
PublicationCentury 2000
PublicationDate 20020000
2002
20020101
PublicationDateYYYYMMDD 2002-01-01
PublicationDate_xml – year: 2002
  text: 20020000
PublicationDecade 2000
PublicationPlace Los Alamitos CA
PublicationPlace_xml – name: Los Alamitos CA
PublicationTitle Proceedings - International Symposium on Multiple-Valued Logic
PublicationTitleAbbrev ISMVL
PublicationYear 2002
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000451777
ssj0020270
Score 1.605618
Snippet The multi-state system reliability is investigated in this paper. The new class of reliability indices is obtained. We have called these indices as dynamic...
The Multi-State System reliability is investigated in this paper. The new class of Reliability Indices is obtained. We have called these indices as Dynamic...
SourceID proquest
pascalfrancis
ieee
SourceType Aggregation Database
Index Database
Publisher
StartPage 144
SubjectTerms Applied sciences
Computer science; control theory; systems
Exact sciences and technology
Logic
Logic and foundations
Logical, boolean and switching functions
Mathematical logic, foundations, set theory
Mathematics
Sciences and techniques of general use
Theoretical computing
Title Design of dynamic reliability indices
URI https://ieeexplore.ieee.org/document/1011082
https://search.proquest.com/docview/27090387
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT8MwDI7YTpwAbYjxGD3AjY6saev0zDYNCRDSAHGr0tSRJqEWreuBf4-TdpsQXLilqhTVjms7fnxm7CohL1lFJvBjDdwPE42-DGgVmQiUGGdk0m1Gd76Ap3c5mVqYnJttLwwiuuIzHNmly-Xnpa5tqIz-cFu0Tgq3A4lserW28RSLkwIAzc2c3IaQPPUWYGfzLDdNMzy5vV88vj24CoVRu2s7XsUWR6qK-GOawRa_dLQzPLOD_33yIevvOvi8561tOmJ7WPTY9cSVa3il8fJmEL23wo9lg9T95dnsNWmNPnudTV_u5n47JsFfBiJc-9IYkHkWcACjBC1IY-mxJoIFeRM8zumShAYCboxQXCDaCeNAEgRCc45aHLNuURZ4wjyZyVCHeoyoIEQ0ElFEMs4ziyojDB-wniUx_WyQMNKWugEb_uDZ7n1E_kMQywG73DAxJfG1OQlVYFlXKclFYjPop3_vfMb23fgVF_M4Z931qsYL1qnyeuiO_xuEYasD
link.rule.ids 310,311,315,782,786,791,792,798,4054,4055,27933,27934,54767
linkProvider IEEE
linkToHtml http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT8JAEN4oHvSkBoz4gB70ZnHptp3tWSAQgZiAxltTtrMJiWkN0IP_3tltgRi9eJumyaYzmc7MzuMbxu4iipKTQHtuqIC7fqTQlR5RgQ4gEd0FuXRT0R3OYPoue30Dk_Owm4VBRNt8hh1D2lp-mqvCpMroDzdN62RwjwIfQiintXYZFYOUAgDl3ZwCB59i9QpiZ_sst2MzPHoczSZvY9uj0KnOrRasmPbIZE0S0uVqi19W2rqewen_PvqMNfYzfM7LzjudswPM6uy-Zxs2nFw7abmK3lnhx7LE6v5yTP2a7EaDvQ7686ehWy1KcJee8Deu1BpkuvA4gE4EEWSzVFcRw4LiCR6mdE1CDR7XWiRcIJod40A6BEJxjkpcsFqWZ3jJHLmQvvJVFzEBH1FLRBHIMF0YXBmheZPVDYvxZ4mFEVfcNVnrh8z27wOKILxQNll7K8SYFNhUJZIM82Idk2ZEpoZ-9ffJbXY8nE_G8Xg0fb5mJ3YZi82A3LDaZlXgLTtcp0XLqsI3txuuVA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+32nd+IEEE+International+Symposium+on+Multiple-Valued+Logic&rft.atitle=Design+of+dynamic+reliability+indices&rft.au=Zaitseva%2C+E.N.&rft.au=Levashenko%2C+V.G.&rft.date=2002-01-01&rft.pub=IEEE&rft.isbn=9780769514628&rft.spage=144&rft.epage=148&rft_id=info:doi/10.1109%2FISMVL.2002.1011082&rft.externalDocID=1011082
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0195-623X&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0195-623X&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0195-623X&client=summon