Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices

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Bibliographic Details
Published in:	2006 IEEE Radiation Effects Data Workshop pp. 19 - 25
Main Authors:	O'Bryan, M.V., Poivey, C., Kniffin, S.D., Buchner, S.P., Ladbury, R.L., Oldham, T.R., Howard, J.W., LaBel, K.A., Sanders, A.B., Berg, M., Marshall, C.J., Marshall, P.W., Kim, H.S., Dung-Phan, A.M., Hawkins, D.K., Carts, M.A., Forney, J.D., Irwin, T., Seidleck, C.M., Cox, S.R., Friendlich, M., Flanigan, R.J., Petrick, D., Powell, W., Karsh, J., Baze, M.P.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-07-2006
Subjects:	Aerospace electronics Cyclotrons digital Electronic equipment testing hybrid devices linear bipolar NASA Protons Single Event Effects Single event upset Space technology Space vehicles spacecraft electronics Test facilities USA Councils
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Description
Summary:	Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices
ISBN:	1424406382 9781424406388
ISSN:	2154-0519 2154-0535
DOI:	10.1109/REDW.2006.295463