Modeling, analyzing, and abstracting single event transient propagation at gate level

Soft errors have become one of the most challenging issues that impact the reliability of modern microelectronic systems at terrestrial altitudes. A new methodology to abstract, model, and analyze Single Event Transient (SET) propagation at different abstraction levels (transistor and gate level) is...

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Bibliographic Details

Published in:	2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) pp. 515 - 518
Main Authors:	Hamad, Ghaith Bany, Hasan, Syed Rafay, Mohamed, Otmane Ait, Savaria, Yvon
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-08-2014
Subjects:	Abstracts Analytical models Attenuation Integrated circuit modeling Libraries Logic gates Transistors
Online Access:	Get full text
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