Fault tolerant system for FPGA using simulation based fault injection technique

Field Programmable Gate Array (FPGA) devices provide high capability in implementing complicated system. The downside of this technology is that it is vulnerable to radiation, and this sensitivity will increase with technology scaling. The improvement of single-event upsets (SEUs) throughout standar...

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Bibliographic Details

Published in:	2015 International Conference on Communications and Signal Processing (ICCSP) pp. 0855 - 0859
Main Authors:	Admane, Nikhila C., Rotake, Dinesh R.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-04-2015
Subjects:	Circuit faults Discharges (electric) Fault tolerance Fault tolerant systems Flip-flops FPGA partial reconfiguration Portable computers run-time reconfiguration (RTR) self-repair Simulation single-event-upset (SEU) Triple-modular redundancy (TMR)
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