Characterisation of european millimetre-wave planar diodes

This paper describes a process for characterisation of millimetre-wave planar diode chips. It comprises dc-characteristics, capacitance, and wide-band (7-220 GHz) scattering parameter measurements and parameter extractions from measurement results. As the first test items, we have characterised plan...

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Bibliographic Details
Published in:	34th European Microwave Conference, 2004 Vol. 2; pp. 921 - 924
Main Authors:	Mottonen, V.S., Mallat, J., Raisanen, A.V.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 2004
Subjects:	Capacitance measurement Circuit testing Coplanar waveguides Current measurement Electrical resistance measurement Parasitic capacitance Scattering parameters Schottky diodes Semiconductor device measurement Semiconductor diodes
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Summary:	This paper describes a process for characterisation of millimetre-wave planar diode chips. It comprises dc-characteristics, capacitance, and wide-band (7-220 GHz) scattering parameter measurements and parameter extractions from measurement results. As the first test items, we have characterised planar Schottky diode chips (varactor and mixer diodes) fabricated by Technical University of Darmstadt. We describe a coplanar waveguide test mount design applied for the measurements and show the measured and extracted results. The S-parameters at 7-220 GHz are obtained for several different bias voltages and currents.
ISBN:	1580539920 9781580539920