Nanotube memories for space applications

Nanotube memories for space applications

The radiation hardness characteristics of nano-electromechanical single-walled carbon nanotube (SWNT) memory elements has been studied. The NRAM bits have been exposed to 100 krad, 1 Mrad and 10 Mrad of gamma-radiation. Initial test results indicate that NRAM is an extremely radiation hard memory.

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Bibliographic Details
Published in:2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Vol. 4; pp. 2300 - 2305 Vol.4
Main Authors: Lovellette, M.N., Campbell, A.B., Hughes, H.L., Lawerence, R.K., Ward, J.W., Meinhold, M., Bengtson, T.R., Carleton, G.F., Segal, B.M., Rueckes, T.
Format: Conference Proceeding
Language:English
Published: IEEE 2004
Subjects:
Capacitors
Carbon nanotubes
Chemical elements
CMOS technology
Electrodes
Nonvolatile memory
Radiation hardening
Random access memory
Read-write memory
Testing
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Description
Summary:The radiation hardness characteristics of nano-electromechanical single-walled carbon nanotube (SWNT) memory elements has been studied. The NRAM bits have been exposed to 100 krad, 1 Mrad and 10 Mrad of gamma-radiation. Initial test results indicate that NRAM is an extremely radiation hard memory.
ISBN:0780381556
9780780381551
ISSN:1095-323X
2996-2358
DOI:10.1109/AERO.2004.1368024