Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device

Soft X-ray exposure effects on CH 3 NH 3 PbI 3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyse...

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Bibliographic Details
Published in:2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) pp. 1657 - 1660
Main Authors: Motoki, Keisuke, Miyazawa, Yu, Kobayashi, Daisuke, Ikegami, Masashi, Miyasaka, Tsutomu, Yamamoto, Tomoyuki, Hirose, Kazuyuki
Format: Conference Proceeding
Language:English
Published: IEEE 01-06-2016
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Summary:Soft X-ray exposure effects on CH 3 NH 3 PbI 3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH 3 NH 3 PbI 3 to PbI 2 due to evaporation of methylammonium iodide.
DOI:10.1109/PVSC.2016.7749904