Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device
Soft X-ray exposure effects on CH 3 NH 3 PbI 3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyse...
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Published in: | 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) pp. 1657 - 1660 |
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Main Authors: | , , , , , , |
Format: | Conference Proceeding |
Language: | English |
Published: |
IEEE
01-06-2016
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Subjects: | |
Online Access: | Get full text |
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Summary: | Soft X-ray exposure effects on CH 3 NH 3 PbI 3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH 3 NH 3 PbI 3 to PbI 2 due to evaporation of methylammonium iodide. |
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DOI: | 10.1109/PVSC.2016.7749904 |