Board life-cycle testing for effective NPI management of wireless products

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Bibliographic Details
Published in:	International Test Conference, 2003. Proceedings. ITC 2003 Vol. 1; p. 1324
Main Author:	Piironen, T.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 2003
Subjects:	Automatic testing Built-in self-test Design for testability Instruments Life testing Manufacturing Production systems Radio frequency Research and development System testing
Online Access:	Get full text
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