Diffraction simulation of SAW filters using SAW source distribution

A new approach for the simulation of the diffraction effect in Surface Acoustic Wave (SAW) filters based on the two dimensional Angular Spectrum of Wave method is proposed. In this simulation, the line source is considered as the particle displacement distribution inbetween the electrode finger'...

Full description

Saved in:
Bibliographic Details
Published in:1996 IEEE Ultrasonics Symposium. Proceedings Vol. 1; pp. 159 - 163 vol.1
Main Authors: Hikino, O., Koshiba, M., Hasegawa, K., Shiba, T., Yuhara, A., Malocha, D.C.
Format: Conference Proceeding
Language:English
Published: IEEE 1996
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Abstract A new approach for the simulation of the diffraction effect in Surface Acoustic Wave (SAW) filters based on the two dimensional Angular Spectrum of Wave method is proposed. In this simulation, the line source is considered as the particle displacement distribution inbetween the electrode finger's overlap region on the surface of the material which was conventionally treated as the uniform intensity line wave source. In this paper, we describe the derivation of the SAW source distribution from the particle displacement which is derived from the three dimensional Finite Element Method (FEM) applied to an IDT finger overlap in the grating structure. Then we apply the above SAW source distribution to the simulation of the frequency response of the SAW filter including the diffraction effect. The frequency dependency of the SAW source distribution is also discussed. The diffraction simulation including the newly presented method along with the conventional method are compared with the experimental results.
AbstractList A new approach for the simulation of the diffraction effect in Surface Acoustic Wave (SAW) filters based on the two dimensional Angular Spectrum of Wave method is proposed. In this simulation, the line source is considered as the particle displacement distribution inbetween the electrode finger's overlap region on the surface of the material which was conventionally treated as the uniform intensity line wave source. In this paper, we describe the derivation of the SAW source distribution from the particle displacement which is derived from the three dimensional Finite Element Method (FEM) applied to an IDT finger overlap in the grating structure. Then we apply the above SAW source distribution to the simulation of the frequency response of the SAW filter including the diffraction effect. The frequency dependency of the SAW source distribution is also discussed. The diffraction simulation including the newly presented method along with the conventional method are compared with the experimental results.
Author Hikino, O.
Koshiba, M.
Hasegawa, K.
Yuhara, A.
Shiba, T.
Malocha, D.C.
Author_xml – sequence: 1
  givenname: O.
  surname: Hikino
  fullname: Hikino, O.
  organization: Dept. of Electr. & Comput. Eng., Central Florida Univ., Orlando, FL, USA
– sequence: 2
  givenname: M.
  surname: Koshiba
  fullname: Koshiba, M.
– sequence: 3
  givenname: K.
  surname: Hasegawa
  fullname: Hasegawa, K.
– sequence: 4
  givenname: T.
  surname: Shiba
  fullname: Shiba, T.
– sequence: 5
  givenname: A.
  surname: Yuhara
  fullname: Yuhara, A.
– sequence: 6
  givenname: D.C.
  surname: Malocha
  fullname: Malocha, D.C.
BookMark eNotj81Kw0AUhQesYFN9ga7yAon3zk1yZ5Yl_lSIuGiLuCr5mZGRNJGZZOHbi62rc_g4fHAisRjGwQixRkgRQd8fqv3u4zVFrYs0V6QIrkQErICowBwXYomQYwKIfCOiEL4AJOQyW4rywVnr63Zy4xAHd5r7-lxHG-8277F1_WR8iOfghs8zCePsWxN3LkzeNfPf-FZc27oP5u4_V-Lw9Lgvt0n19vxSbqrEIcsp6boWJROiyogbksCaG7RgLDMqjQXpjjtqs6xBNFywbrTMWknKGA2AtBLri9cZY47f3p1q_3O8_KVfBoxKvQ
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ULTSYM.1996.583830
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EndPage 163 vol.1
ExternalDocumentID 583830
GroupedDBID 29O
6IE
6IF
6IH
6IK
6IL
6IM
AAJGR
ACGFS
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
CBEJK
CHZPO
IPLJI
JC5
M43
RIE
RIG
RIL
RNS
ID FETCH-LOGICAL-i172t-ddc1273118437b320797b1f0ef771891639d7d3c44b11e7679b924c238ee90013
IEDL.DBID RIE
ISBN 0780336151
9780780336155
ISSN 1051-0117
IngestDate Wed Jun 26 19:22:40 EDT 2024
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i172t-ddc1273118437b320797b1f0ef771891639d7d3c44b11e7679b924c238ee90013
ParticipantIDs ieee_primary_583830
PublicationCentury 1900
PublicationDate 19960000
PublicationDateYYYYMMDD 1996-01-01
PublicationDate_xml – year: 1996
  text: 19960000
PublicationDecade 1990
PublicationTitle 1996 IEEE Ultrasonics Symposium. Proceedings
PublicationTitleAbbrev ULTSYM
PublicationYear 1996
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0020524
ssj0000455250
Score 1.2606108
Snippet A new approach for the simulation of the diffraction effect in Surface Acoustic Wave (SAW) filters based on the two dimensional Angular Spectrum of Wave method...
SourceID ieee
SourceType Publisher
StartPage 159
SubjectTerms Acoustic diffraction
Acoustic waves
Electrodes
Fingers
Finite element methods
Frequency response
Gratings
SAW filters
Surface acoustic waves
Surface treatment
Title Diffraction simulation of SAW filters using SAW source distribution
URI https://ieeexplore.ieee.org/document/583830
Volume 1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwELagEyxAKeItD6xu7SbOJSPqQx0AIbUVMFXxC2WgRX38f3x2WkBiYUs8JJHPyvfd47sj5C5VuZbSZExACSw1UjKVaWAeagXobgbdEvXOozE8veb9Qbrtsx20MNbaUHxm23gZcvlmoTcYKutgii_x_vk-FHmUau3CKZ6ZxARd7WtxGefZ-jPHsO1Z8NhzniSI4HXjne293IppeNGZPkzGb4-o4cva8XW_xq4E1Bke_et7j0nrW71Hn3e4dEL27LxJDn80HjwlvX7l3DJqGuiq-qhneNGFo-P7F-oqzKGvKBbFv4eVGOOnBtvs1hOyWmQ6HEx6I1aPU2CVZylrZowWnqwInPACKulyKEAJx60DD1CeJiaFAZPoNFVCWMigUN450x7TrS2QKp6Rxnwxt-eEeuvin8HyUnlGw50q_bO952cdl2XO0wvSxN2YfcaOGbO4EZd_rl6Rg1gJjYa6Jo31cmNvyP7KbG6Dib8A36SdkQ
link.rule.ids 310,311,782,786,791,792,798,4055,4056,27935,54769
linkProvider IEEE
linkToHtml http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV05T8MwFLagDMAClCJuPLC6dRo7TkbUQ0W0FVJbAVMVXygDLerx__Gz0wISC1viIYn8rHzfO773ELpnMlWc64REIheEac6JTJQgDmojoZqJaOagd-6NxPA1bXfYps-218IYY3zxmanDpc_l67laQ6isASm-2Pnne5yJJAtirW1AxXGTkKIrvS3Kw0Rbd-oIND7zPntK4xgwvGy9s7nnGzkNzRqT_nj0NgAVX1IPL_w1eMXjTvfoX198jGrf-j38vEWmE7RjZlV0-KP14ClqtQtrF0HVgJfFRznFC88tHj28YFtAFn2JoSz-3a-EKD_W0Gi3nJFVQ5NuZ9zqkXKgAikcT1kRrVXk6EoEM16EjJtUZEJGlhorHEQ5ohhnWuhYMSajyIhEZNK5Z8qhujEZkMUzVJnNZ-YcYWdf-DcYmkvHaaiVuXu28_2MpTxPKbtAVdiN6WfomTENG3H55-od2u-NB_1p_3H4dIUOQl00GO0aVVaLtblBu0u9vvXm_gJpKKDk
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=1996+IEEE+Ultrasonics+Symposium.+Proceedings&rft.atitle=Diffraction+simulation+of+SAW+filters+using+SAW+source+distribution&rft.au=Hikino%2C+O.&rft.au=Koshiba%2C+M.&rft.au=Hasegawa%2C+K.&rft.au=Shiba%2C+T.&rft.date=1996-01-01&rft.pub=IEEE&rft.isbn=9780780336155&rft.issn=1051-0117&rft.volume=1&rft.spage=159&rft.epage=163+vol.1&rft_id=info:doi/10.1109%2FULTSYM.1996.583830&rft.externalDocID=583830
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1051-0117&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1051-0117&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1051-0117&client=summon