Future directions for DRAM memory cell technology
The development trend and concerns of cell technologies are reviewed, and future actions for DRAM cell and process module are discussed. The BEST cell and the BST cell are promising for giga bit era DRAM. The BEST cell has simple and robust processes, and the conventional capacitor dielectric film i...
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Published in: | International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) pp. 355 - 358 |
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Main Authors: | , , |
Format: | Conference Proceeding |
Language: | English |
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1998
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Abstract | The development trend and concerns of cell technologies are reviewed, and future actions for DRAM cell and process module are discussed. The BEST cell and the BST cell are promising for giga bit era DRAM. The BEST cell has simple and robust processes, and the conventional capacitor dielectric film is available. The BST film development is the key to realizing giga bit era DRAM by using BST cell. |
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AbstractList | The development trend and concerns of cell technologies are reviewed, and future actions for DRAM cell and process module are discussed. The BEST cell and the BST cell are promising for giga bit era DRAM. The BEST cell has simple and robust processes, and the conventional capacitor dielectric film is available. The BST film development is the key to realizing giga bit era DRAM by using BST cell. |
Author | Hieda, K. Nitayama, A. Kohyama, Y. |
Author_xml | – sequence: 1 givenname: A. surname: Nitayama fullname: Nitayama, A. organization: Microelectron. Eng. Lab., Toshiba Corp., Yokohama, Japan – sequence: 2 givenname: Y. surname: Kohyama fullname: Kohyama, Y. – sequence: 3 givenname: K. surname: Hieda fullname: Hieda, K. |
BookMark | eNotj8tKw0AUQAetYFLdi6v5gcR7M5nXsvShhRZBFNyVZHJHI0lGJumif2-hrs7ucE7KZkMYiLEHhBwR7NN2vdrnaK3JdamEFlcsKVCqDFB_XrMUtAFRal3aGUsAlcjQorll6Tj-ABRaWpkw3BynYyTetJHc1IZh5D5Evnpb7HlPfYgn7qjr-ETuewhd-DrdsRtfdSPd_3POPjbr9-VLtnt93i4Xu6xFXUwZyspYpKYuau0JwGjnSZYKa13JGkAZ8kaBoKJWqqFzs3WWjHVeGgAyYs4eL96WiA6_se2reDpcTsUfnYZGgg |
ContentType | Conference Proceeding |
DBID | 6IE 6IH CBEJK RIE RIO |
DOI | 10.1109/IEDM.1998.746373 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library Online IEEE Proceedings Order Plans (POP) 1998-present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 2156-017X |
EndPage | 358 |
ExternalDocumentID | 746373 |
Genre | orig-research |
GroupedDBID | 29Q 6IE 6IF 6IH 6IK 6IL 6IM 6IN AAJGR ABLEC ACGFS ADZIZ ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK CHZPO IEGSK IJVOP IPLJI JC5 M43 OCL RIE RIG RIL RIO RNS |
ID | FETCH-LOGICAL-i172t-15a891edb2b7fe0087cfe5461b7a5b0068ef8603e2b66de0179c9e89cf5800e83 |
IEDL.DBID | RIE |
ISBN | 0780347749 9780780347748 |
ISSN | 0163-1918 |
IngestDate | Wed Jun 26 19:26:56 EDT 2024 |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i172t-15a891edb2b7fe0087cfe5461b7a5b0068ef8603e2b66de0179c9e89cf5800e83 |
PageCount | 4 |
ParticipantIDs | ieee_primary_746373 |
PublicationCentury | 1900 |
PublicationDate | 19980000 |
PublicationDateYYYYMMDD | 1998-01-01 |
PublicationDate_xml | – year: 1998 text: 19980000 |
PublicationDecade | 1990 |
PublicationTitle | International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) |
PublicationTitleAbbrev | IEDM |
PublicationYear | 1998 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0027595 ssj0000455007 |
Score | 1.3601075 |
Snippet | The development trend and concerns of cell technologies are reviewed, and future actions for DRAM cell and process module are discussed. The BEST cell and the... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 355 |
SubjectTerms | Binary search trees Capacitors Costs Dielectric films Laboratories Microelectronics Random access memory Robustness Substrates Thermal resistance |
Title | Future directions for DRAM memory cell technology |
URI | https://ieeexplore.ieee.org/document/746373 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV09T8MwED3RTrAApYhveWB168SJP0ZEW5WhCPEhsVW1fZEYaBFtB_49PqctRWJhiyNFsZVYd-_dvWeAa-mczF1Eqi5kBScLLU7FLR5joXYT76UwJBQePun7V9PrF2uf7aSFQcTUfIYduky1_DDzS6LKurpQUssGNLQ1tVRrQ6cIUueKLaxV2rp7UUkeIYlJiN0IWcR0x66Md9Zjsy5fCtu96_dGpOAznfplvw5dSTFnsP-v2R5A-0e7xx42UekQdnDagr0t28EjyAbJSITV4Yz-OxZTV9Z7vBmxd-q8_WLE57PFhnZvw8ug_3w75KujE_hbzEgWPCsnxmYYXO50heQ75yssC5U5PSlppxmsjBISc6dUQNqW3qKxvipjBolGHkNzOpviCTB0IYS8UojORjAm6HkXKu-t10WZyVNo0drHH7U7xrhe9tmfd89ht9b0EYVxAc3F5xIvoTEPy6v0Ob8BElKYZA |
link.rule.ids | 310,311,782,786,791,792,798,4054,4055,27934,54767 |
linkProvider | IEEE |
linkToHtml | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NT8JAEJ0IHtSLihi_3YPXQtvtfh2NQCACMYqJN8LuThMPglE4-O_daQEx8eKt26TpbtrNzHsz7y3ADbeWpzYgVeuTLCILrYiKW1GIhcpOnOOxJqFw90kNX3Srna18tgstDCIWzWfYoMuilu9nbkFUWVNlkitegW2RKalKsdaaUIlJnxtvoC1hyv5FyaMASnSB2XXMs5DwmKX1zmqsVwXM2DR77daANHy6Ub7u17ErRdTp7P9rvgdQ_1HvsYd1XDqELZzWYG_DePAIkk5hJcLKgEZ_HgvJK2s93g7YG_XefjFi9Nl8TbzX4bnTHt11o-XhCdFryEnmUSIm2iTobWpVjuQ853IUmUysmgjaaxpzLWOOqZXSI21MZ1Abl4uQQ6Lmx1CdzqZ4Agyt9z7NJaI1AY7F9Lz1uXPGqUwk_BRqtPbxe-mPMS6Xffbn3WvY6Y4G_XG_N7w_h91S4UeExgVU5x8LvITKp19cFZ_2G1GDm7U |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=International+Electron+Devices+Meeting+1998.+Technical+Digest+%28Cat.+No.98CH36217%29&rft.atitle=Future+directions+for+DRAM+memory+cell+technology&rft.au=Nitayama%2C+A.&rft.au=Kohyama%2C+Y.&rft.au=Hieda%2C+K.&rft.date=1998-01-01&rft.pub=IEEE&rft.isbn=9780780347748&rft.issn=0163-1918&rft.eissn=2156-017X&rft.spage=355&rft.epage=358&rft_id=info:doi/10.1109%2FIEDM.1998.746373&rft.externalDocID=746373 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0163-1918&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0163-1918&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0163-1918&client=summon |