Characterization of PT thin films deposited by DC sputtering at different temperatures on Ti/glass and TiO2/Si substrates
Pt thin films were deposited on Ti/Glass and TiO 2 /Si substrates by DC sputtering at temperatures between room and 700°C to optimize its performance as electrodes for ferroelectric devices. Well oriented films in the (111) direction were obtained. Auger electron spectroscopy showed the presence of...
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Published in: | Ferroelectrics Vol. 225; no. 1; pp. 319 - 325 |
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Main Authors: | , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Taylor & Francis Group
01-03-1999
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Subjects: | |
Online Access: | Get full text |
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