Characterization of PT thin films deposited by DC sputtering at different temperatures on Ti/glass and TiO2/Si substrates

Pt thin films were deposited on Ti/Glass and TiO 2 /Si substrates by DC sputtering at temperatures between room and 700°C to optimize its performance as electrodes for ferroelectric devices. Well oriented films in the (111) direction were obtained. Auger electron spectroscopy showed the presence of...

Full description

Saved in:
Bibliographic Details
Published in:Ferroelectrics Vol. 225; no. 1; pp. 319 - 325
Main Authors: Cruz, Ma de la Paz, Siqueiros, Jesús M., Valenzuela, Jose, Machorro, Roberto, Portelles, Jorge J., Fundora, Abel
Format: Journal Article
Language:English
Published: Taylor & Francis Group 01-03-1999
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first