Radiation damage and single event effect results for candidate spacecraft electronics

• Published in: 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) pp. 106 - 122
• Main Authors: O'Bryan, M.V., LaBel, K.A., Reed, R.A., Howard, J.W., Ladbury, R.L., Barth, J.L., Kniffin, S.D., Seidleck, C.M., Marshall, P.W., Marshall, C.J., Kim, H.S., Hawkins, D.K., Sanders, A.B., Carts, M.A., Forney, J.D., Roth, D.R., Kinnison, J.D., Nhan, E., Sahu, K.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2000
• Subjects: Aerospace electronics; Analog-digital conversion; Laboratories; Performance evaluation; Physics; Protons; Single event upset; Space technology; Space vehicles; Testing
• ISBN: 9780780364745; 0780364740
• DOI: 10.1109/REDW.2000.896279

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced damage. We also present data on the susceptibility of parts to functional degradation resulting from total ionizing dose at low dose rates (0.003-4.52 rads(Si)/s). Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.