Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles

• Published in: 2021 IEEE 22nd Latin American Test Symposium (LATS) pp. 1 - 6
• Main Authors: Fabero, Juan C., Korkian, Golnaz, Franco, Francisco J., Mecha, Hortensia, Letiche, Manon, Clemente, Juan A.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 27-10-2021
• Subjects: angle of incidence; Field programmable gate arrays; FPGA; Neutrons; Particle beams; radiation hardness; Random access memory; Shape; Single event upsets; soft error; thermal neutron
• DOI: 10.1109/LATS53581.2021.9651879

This paper presents an experimental study of the SEU susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) SRAM-based FPGA. Experimental results showing Single Event Upsets (SEUs) on configuration RAM (CRAM) cells, Flip-Flops (FFs), and Block RAMs (BRAMs) are provided and discussed. Shapes of multiple events (of various multiplicities) are also analyzed, as well as their dependency with the incident angle of the particle beam against the device's surface.