Diffractive optics for GaN terahertz detectors arrays

Fabrication and experimental tests of materials and optics for Terahertz range used in field effect transistor detectors arrays are described. The method using diffractive optics, fabricated in 3D printing technology, was used for tests with GaN/AlGaN based FETs sub-THz detectors working in 300 GHz...

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Bibliographic Details
Published in:2016 21st International Conference on Microwave, Radar and Wireless Communications (MIKON) pp. 1 - 5
Main Authors: Suszek, J., Sypek, M., Siemion, A., Nowakowska-Siwinska, A., Zagrajek, P., Cywinski, G., Szkudlarek, K., Yahniuk, I., Yatsunenko, S., But, D. B., Coquillat, D., Knap, W.
Format: Conference Proceeding
Language:English
Published: IEEE 01-05-2016
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Summary:Fabrication and experimental tests of materials and optics for Terahertz range used in field effect transistor detectors arrays are described. The method using diffractive optics, fabricated in 3D printing technology, was used for tests with GaN/AlGaN based FETs sub-THz detectors working in 300 GHz atmospheric window. The lens arrays focus energy exactly on the detectors and additionally reduce mutual detector crosstalk. Finally they improve detectors signal to noise ratio by more than one order of magnitude. Moreover such lens arrays are cost-effective, easy reproducible and thin elements.
DOI:10.1109/MIKON.2016.7492049