A thorough way of mapping efficiency with photoluminescence

A thorough way of mapping efficiency with photoluminescence

An alternative method to map essential variables like dark saturation current density, series resistance, and the ultimate cell efficiency will be introduced. This approach will combine the terminally connected diode model with the ideality factor map technique modified to a scenario where current i...

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Bibliographic Details
Published in:2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) pp. 1 - 4
Main Authors: Ogutman, Kortan, Davis, Kristopher O., Schneller, E., Yelundur, Vijay, Schoenfeld, Winston V.
Format: Conference Proceeding
Language:English
Published: IEEE 01-06-2015
Subjects:
Biased-PL
Calibration
ideality factor
Jsc maps
Lighting
Mathematical model
parameter maps
Photoluminescence
Photovoltaic cells
recombination rate
Resistance
Spatial resolution
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Summary:An alternative method to map essential variables like dark saturation current density, series resistance, and the ultimate cell efficiency will be introduced. This approach will combine the terminally connected diode model with the ideality factor map technique modified to a scenario where current is extracted out of the circuitry. Following the delineation of the steps governing the principles of parameter mapping, we elaborate the fidelity that could be gained via improving upon the already existing methods.
DOI:10.1109/PVSC.2015.7356041