Automated Control Setup for Measurement of Characteristics of Interferometer's Opto-Electronic Devices
In the article the principle of operation of single-frequency quadrature interferometers is stated, the basic equation of measurements is given and the main components of the error of increment measurement, which are affected by photodetector modules and analog adders, were found and also schemes of...
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Published in: | 2024 26th International Conference on Digital Signal Processing and its Applications (DSPA) pp. 1 - 6 |
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Format: | Conference Proceeding |
Language: | English |
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IEEE
27-03-2024
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Abstract | In the article the principle of operation of single-frequency quadrature interferometers is stated, the basic equation of measurements is given and the main components of the error of increment measurement, which are affected by photodetector modules and analog adders, were found and also schemes of stands for control of their basic parameters are offered and methods of measurements are described. It is shown that the use of boards based on FPGA, ADC and DAC instead of classical signal generators and oscilloscopes allows to test optoelectronic devices with great economic efficiency without loss of accuracy. |
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AbstractList | In the article the principle of operation of single-frequency quadrature interferometers is stated, the basic equation of measurements is given and the main components of the error of increment measurement, which are affected by photodetector modules and analog adders, were found and also schemes of stands for control of their basic parameters are offered and methods of measurements are described. It is shown that the use of boards based on FPGA, ADC and DAC instead of classical signal generators and oscilloscopes allows to test optoelectronic devices with great economic efficiency without loss of accuracy. |
Author | Alekperova, Bella R. Evgenii, Lavrov A. Denis, Sokolov A. Pavel, Gunin M. Sergey, Donchenko S. |
Author_xml | – sequence: 1 givenname: Bella R. surname: Alekperova fullname: Alekperova, Bella R. email: alekperova@vniiftri.ru organization: Department NIO-8 Russian Metrological Institute of Technical Physics and Radio Engineering (VNIIFTRI),Mendeleevo,Russia – sequence: 2 givenname: Donchenko S. surname: Sergey fullname: Sergey, Donchenko S. organization: Department NIO-8 Russian Metrological Institute of Technical Physics and Radio Engineering (VNIIFTRI),Mendeleevo,Russia – sequence: 3 givenname: Sokolov A. surname: Denis fullname: Denis, Sokolov A. organization: Department NIO-8 Russian Metrological Institute of Technical Physics and Radio Engineering (VNIIFTRI),Mendeleevo,Russia – sequence: 4 givenname: Lavrov A. surname: Evgenii fullname: Evgenii, Lavrov A. organization: Department NIO-8 Russian Metrological Institute of Technical Physics and Radio Engineering (VNIIFTRI),Mendeleevo,Russia – sequence: 5 givenname: Gunin M. surname: Pavel fullname: Pavel, Gunin M. organization: Department NIO-8 Russian Metrological Institute of Technical Physics and Radio Engineering (VNIIFTRI),Mendeleevo,Russia |
BookMark | eNo1j09LwzAYxiPoQee-gWBunlrzNk3bHEs352AyYXoeafIGA21T0lTw21tRT88_-MFzQy4HPyAh98BSACYfN6fXumCV4GnGsjwFJoABqy7IWpay4oLxAsqsuia2nqPvVURDGz_E4Dt6wjiP1PpAX1BNc8Aeh0i9pc2HCkpHDG6KTk8_1X5YosXge1zMw0SPY_TJtkO9oAan6QY_ncbpllxZ1U24_tMVeX_avjXPyeG42zf1IXEAMiZasrwqoWo5k8gNcGt4iwxFptplQFClzq1aHhYiM8aUyugiF1qWrBUKNF-Ru1-uQ8TzGFyvwtf5_z7_BoYYVsU |
ContentType | Conference Proceeding |
DBID | 6IE 6IL CBEJK RIE RIL |
DOI | 10.1109/DSPA60853.2024.10510108 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library Online IEEE Proceedings Order Plans (POP All) 1998-Present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Economics |
EISBN | 9798350361728 |
EndPage | 6 |
ExternalDocumentID | 10510108 |
Genre | orig-research |
GroupedDBID | 6IE 6IL CBEJK RIE RIL |
ID | FETCH-LOGICAL-i119t-c9048718b309e3d13fd3be0e52ab487e1a7c4fa109652ddd7adc645c970b5a1c3 |
IEDL.DBID | RIE |
IngestDate | Wed May 08 06:11:05 EDT 2024 |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i119t-c9048718b309e3d13fd3be0e52ab487e1a7c4fa109652ddd7adc645c970b5a1c3 |
PageCount | 6 |
ParticipantIDs | ieee_primary_10510108 |
PublicationCentury | 2000 |
PublicationDate | 2024-March-27 |
PublicationDateYYYYMMDD | 2024-03-27 |
PublicationDate_xml | – month: 03 year: 2024 text: 2024-March-27 day: 27 |
PublicationDecade | 2020 |
PublicationTitle | 2024 26th International Conference on Digital Signal Processing and its Applications (DSPA) |
PublicationTitleAbbrev | DSPA |
PublicationYear | 2024 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
Score | 1.9165919 |
Snippet | In the article the principle of operation of single-frequency quadrature interferometers is stated, the basic equation of measurements is given and the main... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 1 |
SubjectTerms | Economics error measurement Field programmable gate arrays generator interferometer Length measurement Measurement uncertainty measurements oscilloscope Oscilloscopes Photodetectors Signal generators signals |
Title | Automated Control Setup for Measurement of Characteristics of Interferometer's Opto-Electronic Devices |
URI | https://ieeexplore.ieee.org/document/10510108 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07a8MwEBZNlnbqK6VvNBQ6KbUt2bLGkAdZ2gbSQrcgSyfo0Dg09v_PnfMiQ4duRjYI7izd6fR93zH2lGFQsLkCASYBoZzBfRDPDQLABptJunsjNvJ4qt--8sGQZHLEjgsDAA34DLr02Nzl-9LVVCrDFU5_EFF7W9rka7LWBrMVR-ZlMJ30MkwhJB77EtXdfn3QN6UJG6PTf054xjp7Ah6f7ELLOTuC-QU73pKIl5cs9OqqxGQTPO-vweZ8ClW94JiD8td93Y-XgfcPNZlpqKkD4kTlD6Fhnpf8fVGVYrhricMH0OwgHfY5Gn70x2LTMkF8x7GphDO4IjHcFGhkkD6WwcsCIkgTW-ALiK12KtiYNF8S77223mUqRRdFRWpjJ69Ye17O4ZrxVHsnbUhBKVKocbmxhS5CGinlIkyqbliHDDZbrFUxZltb3f4xfsdOyC2E30r0PWtXvzU8sNbS14-NI1edDaEg |
link.rule.ids | 310,311,782,786,791,792,798,27934,54767 |
linkProvider | IEEE |
linkToHtml | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwELagDGXiVcQbD0hMLklsx81Y9aEi2lKpRWKrHPssMZBUNPn_nNOXOjCwRU4kS3ex73z-vu8IeYoxKOiWAAZJBEyYBPdBPDcwAO10zP3dm2cjD6Zq_Nnq9rxMDttyYQCgAp9B0z9Wd_k2N6UvleEK93-Qp_YeSaFitaJrrVFbYZC8dKeTdoxJBMeDXySam-_3OqdUgaN_8s8pT0ljR8Gjk21wOSMHkJ2T-oZGvLwgrl0WOaabYGlnBTenUyjKBcUslI52lT-aO9rZV2X2Q1UlECfKvz0e5nlJ3xdFznrbpji0C9Ue0iAf_d6sM2DrpgnsKwyTgpkE1yQGnBTNDNyG3FmeQgAy0im-gFArI5wOvepLZK1V2ppYSHRSkEodGn5JalmewRWhUlnDtZMghNeoMa1Epyp1MhDCBJhWXZOGN9h8sdLFmG9sdfPH-COpD2aj4Xz4On67JcfeRR7NFak7Uit-Srgnh0tbPlRO_QVEUaRx |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2024+26th+International+Conference+on+Digital+Signal+Processing+and+its+Applications+%28DSPA%29&rft.atitle=Automated+Control+Setup+for+Measurement+of+Characteristics+of+Interferometer%27s+Opto-Electronic+Devices&rft.au=Alekperova%2C+Bella+R.&rft.au=Sergey%2C+Donchenko+S.&rft.au=Denis%2C+Sokolov+A.&rft.au=Evgenii%2C+Lavrov+A.&rft.date=2024-03-27&rft.pub=IEEE&rft.spage=1&rft.epage=6&rft_id=info:doi/10.1109%2FDSPA60853.2024.10510108&rft.externalDocID=10510108 |