Automated Control Setup for Measurement of Characteristics of Interferometer's Opto-Electronic Devices

In the article the principle of operation of single-frequency quadrature interferometers is stated, the basic equation of measurements is given and the main components of the error of increment measurement, which are affected by photodetector modules and analog adders, were found and also schemes of...

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Published in:2024 26th International Conference on Digital Signal Processing and its Applications (DSPA) pp. 1 - 6
Main Authors: Alekperova, Bella R., Sergey, Donchenko S., Denis, Sokolov A., Evgenii, Lavrov A., Pavel, Gunin M.
Format: Conference Proceeding
Language:English
Published: IEEE 27-03-2024
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Abstract In the article the principle of operation of single-frequency quadrature interferometers is stated, the basic equation of measurements is given and the main components of the error of increment measurement, which are affected by photodetector modules and analog adders, were found and also schemes of stands for control of their basic parameters are offered and methods of measurements are described. It is shown that the use of boards based on FPGA, ADC and DAC instead of classical signal generators and oscilloscopes allows to test optoelectronic devices with great economic efficiency without loss of accuracy.
AbstractList In the article the principle of operation of single-frequency quadrature interferometers is stated, the basic equation of measurements is given and the main components of the error of increment measurement, which are affected by photodetector modules and analog adders, were found and also schemes of stands for control of their basic parameters are offered and methods of measurements are described. It is shown that the use of boards based on FPGA, ADC and DAC instead of classical signal generators and oscilloscopes allows to test optoelectronic devices with great economic efficiency without loss of accuracy.
Author Alekperova, Bella R.
Evgenii, Lavrov A.
Denis, Sokolov A.
Pavel, Gunin M.
Sergey, Donchenko S.
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  givenname: Bella R.
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  givenname: Donchenko S.
  surname: Sergey
  fullname: Sergey, Donchenko S.
  organization: Department NIO-8 Russian Metrological Institute of Technical Physics and Radio Engineering (VNIIFTRI),Mendeleevo,Russia
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  givenname: Sokolov A.
  surname: Denis
  fullname: Denis, Sokolov A.
  organization: Department NIO-8 Russian Metrological Institute of Technical Physics and Radio Engineering (VNIIFTRI),Mendeleevo,Russia
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  givenname: Lavrov A.
  surname: Evgenii
  fullname: Evgenii, Lavrov A.
  organization: Department NIO-8 Russian Metrological Institute of Technical Physics and Radio Engineering (VNIIFTRI),Mendeleevo,Russia
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  givenname: Gunin M.
  surname: Pavel
  fullname: Pavel, Gunin M.
  organization: Department NIO-8 Russian Metrological Institute of Technical Physics and Radio Engineering (VNIIFTRI),Mendeleevo,Russia
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Snippet In the article the principle of operation of single-frequency quadrature interferometers is stated, the basic equation of measurements is given and the main...
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StartPage 1
SubjectTerms Economics
error measurement
Field programmable gate arrays
generator
interferometer
Length measurement
Measurement uncertainty
measurements
oscilloscope
Oscilloscopes
Photodetectors
Signal generators
signals
Title Automated Control Setup for Measurement of Characteristics of Interferometer's Opto-Electronic Devices
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