Defects in Chalcopyrite Semiconductors: Defects in Cu(In,Ga)Se2 Chalcopyrite Semiconductors: A Comparative Study of Material Properties, Defect States, and Photovoltaic Performance (Adv. Energy Mater. 5/2011)

• Published in: Advanced energy materials Vol. 1; no. 5; p. 844
• Main Authors: Cao, Qing, Gunawan, Oki, Copel, Matthew, Reuter, Kathleen B., Chey, S. Jay, Deline, Vaughn R., Mitzi, David B.
• Format: Journal Article
• Language: English
• Published: Weinheim WILEY-VCH Verlag 01-10-2011; WILEY‐VCH Verlag; Wiley Subscription Services, Inc
• Subjects: electronic defects; photovoltaic devices; thin films
• ISSN: 1614-6832; 1614-6840
• DOI: 10.1002/aenm.201190024

David Mitzi and co‐workers have studied defects in Cu(In,Ga)Se2 (CIGS), intentionally induced with controlled processing, with both material and device characterization techniques on p. 845. Structural defects indentified are directly correlated with defect levels extracted from admittance spectroscopy and device behaviors. Reduction of such defects leads to significant improvement of the device photovoltaic performance.