Toward Adaptation of ADCs to Operating Conditions through On-chip Correction

This paper discusses the need for on-chip correction of mixed-signal integrated circuits, and particularly Analog-to-Digital Converters (ADCs), for in-situ adaptation to the operating conditions. By operating conditions, we mean the environmental conditions and the electrical settings applied to the...

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Bibliographic Details

Published in:	2015 IEEE Computer Society Annual Symposium on VLSI pp. 634 - 639
Main Authors:	Kerzerho, V., Guillaume-Sage, L., Azais, F., Comte, M., Renovell, M., Bernard, S.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-07-2015
Subjects:	ADC Estimation Frequency measurement in-situ correction LUT-based correction Manufacturing mixed-signal circuits System-on-chip Table lookup Temperature measurement
Online Access:	Get full text
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