Fault Round Modification Analysis of the advanced encryption standard

This paper describes a new physical analysis technique based on changing the number of the AES rounds. It is an extension of the already known Round Reduction Analysis techniques. Round Modification Analysis is a specific algorithm modification attack. However, the cryptanalysis of the obtained erro...

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Published in:2012 IEEE International Symposium on Hardware-Oriented Security and Trust pp. 140 - 145
Main Authors: Dutertre, J., Mirbaha, Amir-Pasha, Naccache, D., Ribotta, Anne-Lise, Tria, A., Vaschalde, T.
Format: Conference Proceeding
Language:English
Published: IEEE 01-06-2012
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Abstract This paper describes a new physical analysis technique based on changing the number of the AES rounds. It is an extension of the already known Round Reduction Analysis techniques. Round Modification Analysis is a specific algorithm modification attack. However, the cryptanalysis of the obtained erroneous ciphertexts resorts to the differentiation techniques used by Differential Fault Analysis. Faults were induced thanks to a laser in a software AES, either on the round counter itself or on the reference of its total round number, to obtain an increase or a decrease in the number of rounds. We report here successful attacks and their corresponding cryptanalysis.
AbstractList This paper describes a new physical analysis technique based on changing the number of the AES rounds. It is an extension of the already known Round Reduction Analysis techniques. Round Modification Analysis is a specific algorithm modification attack. However, the cryptanalysis of the obtained erroneous ciphertexts resorts to the differentiation techniques used by Differential Fault Analysis. Faults were induced thanks to a laser in a software AES, either on the round counter itself or on the reference of its total round number, to obtain an increase or a decrease in the number of rounds. We report here successful attacks and their corresponding cryptanalysis.
Author Vaschalde, T.
Mirbaha, Amir-Pasha
Naccache, D.
Ribotta, Anne-Lise
Tria, A.
Dutertre, J.
Author_xml – sequence: 1
  givenname: J.
  surname: Dutertre
  fullname: Dutertre, J.
  email: dutertre@emse.fr
  organization: Dept. Syst. et Archit. Securisees (SAS), Ecole Nat. Super. des Mines de St.-Etienne (ENSMSE), Gardanne, France
– sequence: 2
  givenname: Amir-Pasha
  surname: Mirbaha
  fullname: Mirbaha, Amir-Pasha
  email: mirbaha@emse.fr
  organization: Dept. Syst. et Archit. Securisees (SAS), Ecole Nat. Super. des Mines de St.-Etienne (ENSMSE), Gardanne, France
– sequence: 3
  givenname: D.
  surname: Naccache
  fullname: Naccache, D.
  email: david.naccache@ens.fr
  organization: Equipe de cryptographie, Ecole Normale Super. (ENS), Paris, France
– sequence: 4
  givenname: Anne-Lise
  surname: Ribotta
  fullname: Ribotta, Anne-Lise
  email: ribotta@emse.fr
  organization: Dept. Syst. et Archit. Securisees (SAS), Ecole Nat. Super. des Mines de St.-Etienne (ENSMSE), Gardanne, France
– sequence: 5
  givenname: A.
  surname: Tria
  fullname: Tria, A.
  email: assia.tria@cea.fr
  organization: Dept. Syst. et Archit. Securisees (SAS), Ecole Nat. Super. des Mines de St.-Etienne (ENSMSE), Gardanne, France
– sequence: 6
  givenname: T.
  surname: Vaschalde
  fullname: Vaschalde, T.
  email: vaschalde@emse.fr
  organization: Dept. Syst. et Archit. Securisees (SAS), Ecole Nat. Super. des Mines de St.-Etienne (ENSMSE), Gardanne, France
BookMark eNotT0tLxDAYjKigu_YueMkfaM2jaZrjsuxDWBF0BW_LZ_KFjdR0abpC_71FO4cZBoZhZkauYhuRkHvOCs6Zedy-7QvBuCgqIUopywsy42WlpZDSfFySzOh68iWXNyRL6YuN0IpzKW7Jag3npqev7Tk6-ty64IOFPrSRLiI0QwqJtp72R6TgfiBadBSj7YbTXyb1EB107o5ce2gSZpPOyft6tV9u893L5mm52OVHbnifV6o0xgIgCuW1EEpYZpnyjBkcSXrusDbGM6-9qtknCGfGlRUHDWgrL-fk4b83IOLh1IVv6IbD9Fz-Aj6yTgs
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/HST.2012.6224334
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 146732339X
1467323403
9781467323406
9781467323390
EndPage 145
ExternalDocumentID 6224334
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IEGSK
IERZE
OCL
RIE
RIL
ID FETCH-LOGICAL-h191t-65499caaee25f72252c0c05f009ef003f1de899f0f7f580ba2d913261a7aec6f3
IEDL.DBID RIE
ISBN 9781467323413
1467323411
IngestDate Wed Jun 26 19:24:01 EDT 2024
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-h191t-65499caaee25f72252c0c05f009ef003f1de899f0f7f580ba2d913261a7aec6f3
OpenAccessLink https://hal-emse.ccsd.cnrs.fr/emse-00742567
PageCount 6
ParticipantIDs ieee_primary_6224334
PublicationCentury 2000
PublicationDate 2012-06
PublicationDateYYYYMMDD 2012-06-01
PublicationDate_xml – month: 06
  year: 2012
  text: 2012-06
PublicationDecade 2010
PublicationTitle 2012 IEEE International Symposium on Hardware-Oriented Security and Trust
PublicationTitleAbbrev HST
PublicationYear 2012
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000751132
Score 1.5755912
Snippet This paper describes a new physical analysis technique based on changing the number of the AES rounds. It is an extension of the already known Round Reduction...
SourceID ieee
SourceType Publisher
StartPage 140
SubjectTerms Algorithm design and analysis
Circuit faults
Encryption
Radiation detectors
Semiconductor lasers
Strontium
Title Fault Round Modification Analysis of the advanced encryption standard
URI https://ieeexplore.ieee.org/document/6224334
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwED7RTkyAWsRbHhhJ68SJ7czQKgsI0SKxVY5zFgNKUGkG_n3PblKExMJi-SFZ9ln2-V7fAdzqsrIJ1yZSGcoodamMSi-sKCXiMk5RZEE1UCzU05t-mHmYnLt9LAwiBucznPhqsOVXjW29qmwqid8IkQ5goHK9i9Xa61OI9fmk6SF2SyqR0Osc95BOXVv0ZkqeT4vF0vt1JZNuzl_JVQJvmR_9b1XHMP4J0mPPe_ZzAgdYj2A2N-3Hhr34ZEnssam8I1CgPevRR1jjGH36WG_8ZzTR-js8HKzXK4zhdT5b3hdRlykheid5axNJL-VZYxCTzCm6oonllmeOPlBIhXBxhSRYOe6UyzQvTVLlRCwZG2XQSidOYVg3NZ4By2mQW7qMTshUlx6QDzWXaEquLcbqHEaeBKvPHRjGqtv9xd_dl3DoqbzzrbqC4Wbd4jUMvqr2JhzfFhbslnY
link.rule.ids 310,311,782,786,791,792,798,27934,54768
linkProvider IEEE
linkToHtml http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwED7RMsAEqEW88cBIWidO7HSGVkG0FaJFYqsc5ywG1KDSDPx7zm5ShMTCEiW2ZMVnne_9HcBNmhcm4qkOVIIyiG0sg9wZK0qJMA9jFIl3DWQzNX1N74cOJud2WwuDiD75DHvu1cfyi9JUzlXWlyRvhIhbsJvEpCZvqrW2HhUSfq5tuq_ekkpEdD-HDahT_S2aQCUf9LPZ3GV2Rb161V_tVbx0GR38778OoftTpseetgLoCHZw2YHhSFfva_bs2iWxSVm4VCBPfdbgj7DSMlL7WBP-Z7TQ6stfHazxLHThZTSc32VB3SsheCOLax1IZ-cZrRGjxCpi0shwwxNLKhTSQ9iwQDKtLLfKJinPdVQMiFgy1EqjkVYcQ3tZLvEE2IAmuSF2tELGae4g-TDlEnXOU4OhOoWOI8HiYwOHsah3f_b38DXsZfPJeDF-mD6ew76j-CbT6gLa61WFl9D6LKorf5TfOz2ZyA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2012+IEEE+International+Symposium+on+Hardware-Oriented+Security+and+Trust&rft.atitle=Fault+Round+Modification+Analysis+of+the+advanced+encryption+standard&rft.au=Dutertre%2C+J.&rft.au=Mirbaha%2C+Amir-Pasha&rft.au=Naccache%2C+D.&rft.au=Ribotta%2C+Anne-Lise&rft.date=2012-06-01&rft.pub=IEEE&rft.isbn=9781467323413&rft.spage=140&rft.epage=145&rft_id=info:doi/10.1109%2FHST.2012.6224334&rft.externalDocID=6224334
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781467323413/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781467323413/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781467323413/sc.gif&client=summon&freeimage=true