Radiation damage at the coherent anatase TiO2/SrTiO3 interface under Ne ion irradiation

• Published in: Journal of nuclear materials Vol. 429; no. 1-3; pp. 177 - 184
• Main Authors: Zhuo, M.J., Uberuaga, B.P., Yan, L., Fu, E.G., Dickerson, R.M., Wang, Y.Q., Misra, A., Nastasi, M., Jia, Q.X.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01-10-2012; Elsevier
• Subjects: Applied sciences; Controled nuclear fusion plants; Energy; Energy. Thermal use of fuels; Exact sciences and technology; Fission nuclear power plants; Fuels; Installations for energy generation and conversion: thermal and electrical energy; Nuclear fuels; Rutherford backscattering; Ion irradiation; Irradiation defect; X ray spectrometry; X ray diffraction; Radiation damage; Nuclear reactor
• ISSN: 0022-3115; 1873-4820
• DOI: 10.1016/j.jnucmat.2012.05.027

Epitaxial anatase TiO2 films with thickness of around 300nm were deposited on SrTiO3 and irradiated with 250keV Ne ions at room temperature. X-ray diffraction, Rutherford backscattering spectrometry, and transmission electron microscopy were used to characterize the microstructural changes under irradiation. Two primary features are observed in the irradiated material: a damaged layer with a high density of nano-sized defects including dislocation loops was observed in the TiO2 film and, near the TiO2/SrTiO3 interface, a defect denuded zone formed on the TiO2 side while an amorphous layer formed on the SrTiO3 side. Atomistic calculations attribute the formation of both the defect-denuded zone and the interfacial amorphous layer not to the interaction between the irradiation induced defects and the TiO2/SrTiO3 hetero-interface but rather differences in chemical potential and mobilities for defects in each of the two phases.