Characterisation of Ga1-xInxSb quantum wells (x~0.3) grown on GaAs using AlGaSb interface misfit buffer

Characterisation of Ga1-xInxSb quantum wells (x~0.3) grown on GaAs using AlGaSb interface misfit buffer

GaInSb multiple quantum wells (MQW) grown on GaAs using an AlGaSb interface misfit (IMF) metamorphic buffer layer technique exhibit superior infrared photoluminescence (PL) at room temperature compared with MQW grown directly on GaSb. PL emission was obtained in the range from 1.7 μm (4 K) to 1.9 μm...

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Bibliographic Details
Published in:AIMS materials science Vol. 2; no. 2; pp. 86 - 96
Main Authors: Jonathan P. Hayton, Andrew R.J. Marshall, Michael D. Thompson, Anthony Krier
Format: Journal Article
Language:English
Published: AIMS Press 01-01-2015
Subjects:
AlGaSb
GaSb
IMF
InGaSb
Interfacial Misfit Array
MQW
photoluminescence
Quantum Well
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Summary:GaInSb multiple quantum wells (MQW) grown on GaAs using an AlGaSb interface misfit (IMF) metamorphic buffer layer technique exhibit superior infrared photoluminescence (PL) at room temperature compared with MQW grown directly on GaSb. PL emission was obtained in the range from 1.7 μm (4 K) to 1.9 μm (300 K) from Ga1-xInxSb samples containing five compressively strained QW with In content x~0.3. Structural and optical characterisation confirms that the AlGaSb IMF growth technique is promising for the development of photonic devices operating at extended wavelengths based on GaAs substrates.
ISSN:2372-0484
DOI:10.3934/matersci.2015.2.86