Microstructural and electronic properties of highly oriented Tl/sub 0.5/Pb/sub 0.5/Sr/sub 2/Cu/sub 2/O/sub 7/ films on LaAlO/sub 3

Microstructural and electronic properties of highly oriented Tl/sub 0.5/Pb/sub 0.5/Sr/sub 2/Cu/sub 2/O/sub 7/ films on LaAlO/sub 3

Epitaxial Tl/sub 0.5/Pb/sub 0.5/Sr/sub 2/CaCu/sub 2/O/sub 7/ films produced by RF magnetron sputtering followed by annealing in the presence of thallium oxide vapor have been produced on

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity Vol. 3; no. 1; pp. 1222 - 1225
Main Authors: Kountz, D.J., Gai, P.L., Wilker, C., Holstein, W.L., Pellicone, F.M., Brainard, R.J.
Format: Journal Article
Language:English
Published: IEEE 01-03-1993
Subjects:
Annealing
Copper
Crystalline materials
Electrons
Lattices
Sputtering
Strontium
Superconducting films
Superconductivity
Surface resistance
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Description
Summary:Epitaxial Tl/sub 0.5/Pb/sub 0.5/Sr/sub 2/CaCu/sub 2/O/sub 7/ films produced by RF magnetron sputtering followed by annealing in the presence of thallium oxide vapor have been produced on
ISSN:1051-8223
1558-2515
DOI:10.1109/77.233405