Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

We studied the growth of the surface oxide layer on four different CdTe and CdZnTe X-ray and gamma-ray detector-grade samples using spectroscopic ellipsometry. We observed gradual oxidization of CdTe and CdZnTe after chemical etching in bromine solutions. From X-ray photoelectron spectroscopy measur...

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Bibliographic Details
Published in:	Science and technology of advanced materials Vol. 17; no. 1; pp. 792 - 798
Main Authors:	Zázvorka, Jakub, Franc, Jan, Beran, Lukáš, Moravec, Pavel, Pekárek, Jakub, Veis, Martin
Format:	Journal Article
Language:	English
Published:	United States Taylor & Francis 01-01-2016 Taylor & Francis Ltd Taylor & Francis Group
Subjects:	201 Electronics / Semiconductor / TCOs 212 Surface and interfaces 40 Optical Bromine Cadmium zinc tellurides CdTe Chemical etching Chemical treatment ellipsometry Gamma ray detectors Leakage current magnetic and electronic device materials Optical, Magnetic and Electronic Device Materials oxidation Photoelectrons Spectroellipsometry Surface layers Surface preparation Tellurium XPS 40 Optical ellipsometry 212 Surface and interfaces oxidation 201 Electronics / Semiconductor / TCOs leakage current XPS CdTe magnetic and electronic device materials
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