Quantum lock-in force sensing using optical clock Doppler velocimetry
Force sensors are at the heart of different technologies such as atomic force microscopy or inertial sensing. These sensors often rely on the measurement of the displacement amplitude of mechanical oscillators under applied force. The best sensitivity is typically achieved when the force is alternat...
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Published in: | Nature communications Vol. 8; no. 1; p. 14157 |
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Main Authors: | , |
Format: | Journal Article |
Language: | English |
Published: |
London
Nature Publishing Group UK
10-02-2017
Nature Publishing Group Nature Portfolio |
Subjects: | |
Online Access: | Get full text |
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Summary: | Force sensors are at the heart of different technologies such as atomic force microscopy or inertial sensing. These sensors often rely on the measurement of the displacement amplitude of mechanical oscillators under applied force. The best sensitivity is typically achieved when the force is alternating at the mechanical resonance frequency of the oscillator, thus increasing its response by the mechanical quality factor. The measurement of low-frequency forces, that are below resonance, is a more difficult task as the resulting oscillation amplitudes are significantly lower. Here we use a single-trapped
88
Sr
+
ion as a force sensor. The ion is electrically driven at a frequency much lower than the trap resonance frequency. We measure small amplitude of motion by measuring the periodic Doppler shift of an atomic optical clock transition, enhanced using the quantum lock-in technique. We report frequency force detection sensitivity as low as 2.8 × 10
−20
NHz
−1/2
.
Existing force sensors are designed for driving frequencies above tens of kHz due to heating and sensitivity loss. Here the authors demonstrate precise force metrology for below kHz frequency range by combining the Doppler-shifted optical transition in trapped ion and quantum lock-in technique. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 2041-1723 2041-1723 |
DOI: | 10.1038/ncomms14157 |