Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

• Published in: IEEE transactions on nuclear science Vol. 50; no. 3; pp. 622 - 634
• Main Authors: Reed, R.A., Kinnison, J., Pickel, J.C., Buchner, S., Marshall, P.W., Kniffin, S., LaBel, K.A.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01-06-2003; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Devices; Frequency estimation; Ground testing; Ground tests; Ionization; Microelectronics; NASA; Prediction methods; Radiation effects; Space environment; Space radiation; Space technology; Space vehicles; Spacecraft; Strategy; System testing; Test facilities
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/TNS.2003.813331

Over the past 27 years, or so, increased concern over single-event effects (SEEs) in spacecraft systems has resulted in research, development, and engineering activities centered around a better understanding of the space radiation environment, SEE predictive methods, ground test protocols, and test facility developments. This research has led to fairly well developed methods for assessing the impact of the space radiation environment on systems that contain SEE sensitive devices and the development of mitigation strategies either at the system or device level. However, as new technology has emerged, these ground test and predictive methods have certain short falls.