Analysis of Wear-Out Degradation of a DFB Laser Using an Optical-Beam-Induced Current Monitor

• Published in: IEEE transactions on electron devices Vol. 54; no. 8; pp. 1852 - 1859
• Main Authors: Takeshita, T., Yamamoto, M., Iga, R., Sugo, M., Kondo, Y., Kato, K.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01-08-2007; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Aging; Applied sciences; Cladding; Degradation; Diffraction gratings; Diffusion; distributed feedback (DFB) lasers; Electronics; Exact sciences and technology; failure analysis; Fundamental areas of phenomenology (including applications); Gratings (spectra); indium compounds; Indium phosphide; Indium phosphides; Laser applications; laser reliability; Lasers; Measurement by laser beam; Monitors; Optics; photon beams; Physics; quantum well lasers; ruthenium; semiconductor lasers; Semiconductor lasers; laser diodes; Temperature; Testing, measurement, noise and reliability; Waveguide lasers; Distributed feedback laser; Ageing; indium compounds; Cladding; Waveguide; Beam currents; laser reliability; Induced current; Optical beam; ruthenium; distributed feedback (DFB) lasers; Current sensor; Failure analysis; Wear; Quantum well lasers; Aging; semiconductor lasers; photon beams; Electric current measurement; Measurement method; Reliability; Damaging; Semiconductor laser
• ISSN: 0018-9383; 1557-9646
• DOI: 10.1109/TED.2007.900975

We investigated the degradation behavior of distributed feedback lasers by employing the optical-beam-induced current measurement technique. We showed that the degradation mechanism is governed by diffused defects at the waveguide other than those in the vicinity of the antireflection facet. In addition, we found that a diffused source is probably generated in the upper InP cladding layer above the grating during the growth of the upper InP cladding layer.