Application of the Feature Selective Validation Method to Pattern Recognition

• Published in: IEEE transactions on electromagnetic compatibility Vol. 56; no. 4; pp. 808 - 816
• Main Authors: Ventosa, Oriol, Pous, Marc, Silva, Ferran, Jauregui, Ricardo
• Format: Journal Article Conference Proceeding Publication
• Language: English
• Published: New York, NY IEEE 01-08-2014; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithms; Applied sciences; Communication forms and techniques (written, oral, electronic, etc.); Communication, education, history, and philosophy; Compatibilitat electromagnètica; COMPUTATIONAL ELECTROMAGNETICS CEM; Computational electromagnetics method; Correlation; data comparison; Electromagnetic compatibility; Enginyeria electrònica; Exact sciences and technology; Exposure; Feature extraction; Feature selective validation; feature selective validation (FSV) method; FSV; Fundamental areas of phenomenology (including applications); Imaging and optical processing; Information, signal and communications theory; Instrumentació i mesura; Interpolation; Logic; Optics; Pattern recognition; Physics; Self-organized systems; Shape; Signal processing; Statistical physics, thermodynamics, and nonlinear dynamical systems; SYSTEM; Telecommunications and information theory; Transient analysis; validation; Vectors; Àrees temàtiques de la UPC; data comparison; Adaptability; Electromagnetic compatibility; Computational electromagnetics; Computational electromagnetics method; Pattern recognition; Algorithm; Comparative study; Standards; feature selective validation (FSV) method; validation
• ISSN: 0018-9375; 1558-187X
• DOI: 10.1109/TEMC.2013.2291494

Pattern recognition is a mature field; however, in recent years it has developed a special interest. Many methods have been developed exclusively focusing on this subject; all of them, however, are centered on certain types of patterns. In this paper, a new method, which aims to be as flexible as possible, is proposed. This technique is based on a validation standard method used in electromagnetic compatibility named feature selective validation. The final objective of developing the algorithm is to make it adaptable to diverse types of patterns. An application on the recognition of transient patterns is exposed as an example. Nevertheless, a wide range of other types of signals is likely to be treated with the same logic.