Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy

• Published in: Journal of microscopy (Oxford) Vol. 213; no. 3; pp. 214 - 224
• Main Author: Dingley, D.
• Format: Journal Article
• Language: English
• Published: Oxford, UK Blackwell Science Ltd 01-03-2004
• Subjects: Crystallography - methods; Diagnostic Imaging - instrumentation; Diagnostic Imaging - methods; Electron backscatter diffraction; Microscopy, Electron - instrumentation; Microscopy, Electron - methods; orientation imaging microscopy
• ISSN: 0022-2720; 1365-2818
• DOI: 10.1111/j.0022-2720.2004.01321.x

Summary
Ten years ago electron backscatter diffraction (EBSD) became available to a wider group active in materials research. This paper highlights some of the more significant developments in camera technology and software developments that have arisen since then. The use of slow‐scan charge couple device cameras for phase identification and rapid determination of orientation image micrographs is reviewed. The current limiting spatial resolution of the technique is shown to be less than 10 nm. A procedure for improving lattice spacing measurement by utilizing the full resolution of the camera is described with experimental measurements on silicon and nickel showing relative errors of plus/minus 3%. An investigation of partially recrystallized aluminium shows how the recrystallized fraction can be extracted with confidence but that the mapping of substructure in the highly deformed regions is questionable. Phase identification is described for complex cases in which the phase data tabulated in standard databases do not correspond to what is observed in the EBSD patterns. Phase mapping in a complex mineral in which chemical data and EBSD data are collected simultaneously is shown to be improved by recording both the chemical and the EBSD data into computer memory and proceeding with the phase discrimination and orientation measurement in off‐line analysis.