Review and comparison of experimental techniques used for determination of thin film electro-optic coefficients

The results of electro‐optic coefficient measurements performed with three commonly applied techniques used to assess electro‐optic coefficients: the Mach–Zehnder, the Teng–Man, and the attenuated total reflectance technique are reported. It is shown that the signal obtained by the Mach–Zehnder and...

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Published in:	Physica status solidi. A, Applications and materials science Vol. 212; no. 9; pp. 1867 - 1879
Main Authors:	Nitiss, Edgars, Bundulis, Arturs, Tokmakov, Andrejs, Busenbergs, Janis, Linina, Elza, Rutkis, Martins
Format:	Journal Article
Language:	English
Published:	Weinheim Blackwell Publishing Ltd 01-09-2015 Wiley Subscription Services, Inc
Subjects:	Attenuation electro-optic coefficients electro-optical effects Electro-optics Materials science Mathematical analysis Modulation nonlinear optics organic materials Reflectance Reflection Reflectivity Thin films
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Abstract	The results of electro‐optic coefficient measurements performed with three commonly applied techniques used to assess electro‐optic coefficients: the Mach–Zehnder, the Teng–Man, and the attenuated total reflectance technique are reported. It is shown that the signal obtained by the Mach–Zehnder and Teng–Man techniques is strongly influenced by the multiple internal reflection and piezo‐ and electrostrictive thickness change effects, which in our opinion have not been addressed sufficiently in the literature. A novel approach based on using Abelès matrix formalism is implemented for the retrieval of electro‐optic coefficients from experimental data. The measurement results, errors, and comparison of the obtained electro‐optic coefficient values with the ones expected from the second harmonic generation measurements are discussed. It is demonstrated that, by applying incidence angle scan measurements in Teng–Man technique, an analytic approximation that ignores multiple internal reflection and thickness change effects can provide an electro‐optic coefficient estimate within the precision of 2%. This value is much less than the error caused by the thickness change effect that may appear in the attenuated total reflectance technique which inherently has low sensitivity to the thickness modulation effects in the sample. The authors report the results of electro‐optic coefficient measurements performed with three commonly applied techniques used to assess electro‐optic coefficients: the Mach‐Zehnder, the Teng‐Man and the attenuated total reflectance technique. As shown, the correct interpretation of the experimental data obtained by the mentioned techniques requires the full understanding of the effects taking place in the sample.
AbstractList	The results of electro-optic coefficient measurements performed with three commonly applied techniques used to assess electro-optic coefficients: the Mach-Zehnder, the Teng-Man, and the attenuated total reflectance technique are reported. It is shown that the signal obtained by the Mach-Zehnder and Teng-Man techniques is strongly influenced by the multiple internal reflection and piezo- and electrostrictive thickness change effects, which in our opinion have not been addressed sufficiently in the literature. A novel approach based on using Abelès matrix formalism is implemented for the retrieval of electro-optic coefficients from experimental data. The measurement results, errors, and comparison of the obtained electro-optic coefficient values with the ones expected from the second harmonic generation measurements are discussed. It is demonstrated that, by applying incidence angle scan measurements in Teng-Man technique, an analytic approximation that ignores multiple internal reflection and thickness change effects can provide an electro-optic coefficient estimate within the precision of 2%. This value is much less than the error caused by the thickness change effect that may appear in the attenuated total reflectance technique which inherently has low sensitivity to the thickness modulation effects in the sample. The results of electro‐optic coefficient measurements performed with three commonly applied techniques used to assess electro‐optic coefficients: the Mach–Zehnder, the Teng–Man, and the attenuated total reflectance technique are reported. It is shown that the signal obtained by the Mach–Zehnder and Teng–Man techniques is strongly influenced by the multiple internal reflection and piezo‐ and electrostrictive thickness change effects, which in our opinion have not been addressed sufficiently in the literature. A novel approach based on using Abelès matrix formalism is implemented for the retrieval of electro‐optic coefficients from experimental data. The measurement results, errors, and comparison of the obtained electro‐optic coefficient values with the ones expected from the second harmonic generation measurements are discussed. It is demonstrated that, by applying incidence angle scan measurements in Teng–Man technique, an analytic approximation that ignores multiple internal reflection and thickness change effects can provide an electro‐optic coefficient estimate within the precision of 2%. This value is much less than the error caused by the thickness change effect that may appear in the attenuated total reflectance technique which inherently has low sensitivity to the thickness modulation effects in the sample. The authors report the results of electro‐optic coefficient measurements performed with three commonly applied techniques used to assess electro‐optic coefficients: the Mach‐Zehnder, the Teng‐Man and the attenuated total reflectance technique. As shown, the correct interpretation of the experimental data obtained by the mentioned techniques requires the full understanding of the effects taking place in the sample. The results of electro-optic coefficient measurements performed with three commonly applied techniques used to assess electro-optic coefficients: the Mach-Zehnder, the Teng-Man, and the attenuated total reflectance technique are reported. It is shown that the signal obtained by the Mach-Zehnder and Teng-Man techniques is strongly influenced by the multiple internal reflection and piezo- and electrostrictive thickness change effects, which in our opinion have not been addressed sufficiently in the literature. A novel approach based on using Abeles matrix formalism is implemented for the retrieval of electro-optic coefficients from experimental data. The measurement results, errors, and comparison of the obtained electro-optic coefficient values with the ones expected from the second harmonic generation measurements are discussed. It is demonstrated that, by applying incidence angle scan measurements in Teng-Man technique, an analytic approximation that ignores multiple internal reflection and thickness change effects can provide an electro-optic coefficient estimate within the precision of 2%. This value is much less than the error caused by the thickness change effect that may appear in the attenuated total reflectance technique which inherently has low sensitivity to the thickness modulation effects in the sample. The authors report the results of electro-optic coefficient measurements performed with three commonly applied techniques used to assess electro-optic coefficients: the Mach-Zehnder, the Teng-Man and the attenuated total reflectance technique. As shown, the correct interpretation of the experimental data obtained by the mentioned techniques requires the full understanding of the effects taking place in the sample.
Author	Nitiss, Edgars Busenbergs, Janis Rutkis, Martins Tokmakov, Andrejs Bundulis, Arturs Linina, Elza
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Cites_doi	10.1364/JOSAB.7.001239 10.1063/1.363783 10.1063/1.329269 10.1364/JOSAB.4.000968 10.1364/OE.21.029240 10.1103/PhysRevA.41.5098 10.1063/1.356331 10.1364/JOSAB.20.001932 10.1016/j.optcom.2012.09.020 10.1021/ma00093a032 10.3952/physics.v52i1.2264 10.1016/S0030-4018(97)00208-3 10.1103/PhysRevB.41.1636 10.1063/1.103107 10.2529/PIERS080902023149 10.1021/jp310961a 10.3390/polym3031310 10.1063/1.99785 10.1063/1.434213 10.1016/S0009-2614(96)01519-9 10.1007/s10043-009-0002-y 10.1016/j.matchemphys.2015.02.035 10.1364/AO.29.002839 10.1063/1.101827 10.1016/j.optlastec.2005.08.003 10.1088/0022-3727/27/2/030 10.1007/s003400050053 10.1016/j.optlastec.2006.06.002 10.1142/S0218863507003706 10.1364/JOSAB.10.001894 10.1364/JOSAB.8.002311 10.1364/AO.44.006235 10.1364/OE.14.008866 10.1021/ma9618989 10.1364/AO.47.00C219 10.1364/AO.10.002395 10.1016/S0301-0104(99)00079-8 10.1021/ja8007424
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Snippet	The results of electro‐optic coefficient measurements performed with three commonly applied techniques used to assess electro‐optic coefficients: the... The results of electro-optic coefficient measurements performed with three commonly applied techniques used to assess electro-optic coefficients: the...
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SubjectTerms	Attenuation electro-optic coefficients electro-optical effects Electro-optics Materials science Mathematical analysis Modulation nonlinear optics organic materials Reflectance Reflection Reflectivity Thin films
Title	Review and comparison of experimental techniques used for determination of thin film electro-optic coefficients
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