Electronic property investigations of single-walled carbon nanotube bundles in situ within a transmission electron microscope: an evaluation

• Published in: Journal of microscopy (Oxford) Vol. 231; no. 1; pp. 144 - 155
• Main Authors: ASLAM, Z, ABRAHAM, M, BROWN, A, RAND, B, BRYDSON, R
• Format: Journal Article
• Language: English
• Published: Oxford, UK Blackwell Publishing Ltd 01-07-2008
• Subjects: Deformation; eel; EELS; I-V measurements; Single walled carbon nanotubes; STM; TEM; TEM-STM
• ISSN: 0022-2720; 1365-2818
• DOI: 10.1111/j.1365-2818.2008.02025.x

We have evaluated a combined transmission electron microscopy (TEM)-scanning tunnelling microscopy (STM) (hence TEM-STM) sample holder for the investigation of the mechanical and electrical properties of individual bundles of single-walled carbon nanotubes (SWCNTs) together with their simultaneous observation, analysis and mechanical modification in the TEM. Current-voltage (I-V) measurements from bundles of SWCNTs were observed to change as the bundles were deformed both reversibly and irreversibly, although the observed behaviour was somewhat complex. Electron energy loss spectroscopy (EELS) analysis revealed measurable changes in the bonding of the carbon atoms within the graphene layers upon bundle deformation, with measurable changes in the π*/(π*+σ*) peak ratios observed at the carbon K-edge. Reversible deformation of the bundles was consistent with the sensitivity of σ bonding to deviations from nonplanarity, whereas irreversible deformation was consistent with the introduction of nonhexagonal defects into the graphene sheets.