Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films

• Published in: Measurement science review Vol. 14; no. 3; pp. 164 - 170
• Main Authors: Pompeo, N., Torokhtii, K., Silva, E.
• Format: Journal Article
• Language: English
• Published: Bratislava De Gruyter Open 01-06-2014; De Gruyter Poland; Sciendo
• Subjects: dielectric resonators; Dielectrics; Impedance; low temperature; Magnetic fields; Microwave frequencies; Microwave methods; Resonators; Superconducting films; Superconductivity; superconductors; surface impedance; Thin films
• ISSN: 1335-8871; 1335-8871
• DOI: 10.2478/msr-2014-0022

We present the development, realization and setup of dielectric resonators, for the purpose of measuring the surface impedance at microwave frequencies of superconducting thin films. We focus on resonators designed to operate in dc magnetic fields, optimized for the measurements of the variation of the surface impedance with the applied field. Two resonators, operating at 8 and 48 GHz, are presented. We discuss different approaches to the measurement of the resonator parameters, with particular attention to the nonidealities of real setups in a cryogenic environment. Finally, we present some sample measurement of high-T
and low-T
superconducting films.