XPS characterization of nitrogen-doped carbon nanotubes

In this work, CNTs have been bombarded with low energy N ions. X‐ray photoelectron spectroscopy have been used to determine the binding configuration of the N‐doped CNTs. AFM was also used to determine their morphology and mechanical properties. The same morphology is maintained after the N2+ bombar...

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Bibliographic Details
Published in:Physica status solidi. A, Applications and materials science Vol. 203; no. 6; pp. 1069 - 1075
Main Authors: Morant, C., Andrey, J., Prieto, P., Mendiola, D., Sanz, J. M., Elizalde, E.
Format: Journal Article Conference Proceeding
Language:English
Published: Berlin WILEY-VCH Verlag 01-05-2006
WILEY‐VCH Verlag
Wiley-VCH
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Summary:In this work, CNTs have been bombarded with low energy N ions. X‐ray photoelectron spectroscopy have been used to determine the binding configuration of the N‐doped CNTs. AFM was also used to determine their morphology and mechanical properties. The same morphology is maintained after the N2+ bombardment. XPS analysis shows that the N 1s core level spectra for N‐doped CNTs can be deconvoluted in terms of two peaks related to sp2 (C–N=C) and sp3 hybridization (C–N configuration). This interpretation is in concordance with the increase of the hardness observed by AFM nanoindentations when the sp3 contributions increase. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Bibliography:ArticleID:PSSA200566110
istex:86E385AC28689C02C6D24963684FFD3F65D161CE
ark:/67375/WNG-86PVDXNK-C
ISSN:1862-6300
1862-6319
DOI:10.1002/pssa.200566110