XPS characterization of nitrogen-doped carbon nanotubes
In this work, CNTs have been bombarded with low energy N ions. X‐ray photoelectron spectroscopy have been used to determine the binding configuration of the N‐doped CNTs. AFM was also used to determine their morphology and mechanical properties. The same morphology is maintained after the N2+ bombar...
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Published in: | Physica status solidi. A, Applications and materials science Vol. 203; no. 6; pp. 1069 - 1075 |
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Main Authors: | , , , , , |
Format: | Journal Article Conference Proceeding |
Language: | English |
Published: |
Berlin
WILEY-VCH Verlag
01-05-2006
WILEY‐VCH Verlag Wiley-VCH |
Subjects: | |
Online Access: | Get full text |
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Summary: | In this work, CNTs have been bombarded with low energy N ions. X‐ray photoelectron spectroscopy have been used to determine the binding configuration of the N‐doped CNTs. AFM was also used to determine their morphology and mechanical properties. The same morphology is maintained after the N2+ bombardment. XPS analysis shows that the N 1s core level spectra for N‐doped CNTs can be deconvoluted in terms of two peaks related to sp2 (C–N=C) and sp3 hybridization (C–N configuration). This interpretation is in concordance with the increase of the hardness observed by AFM nanoindentations when the sp3 contributions increase. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
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Bibliography: | ArticleID:PSSA200566110 istex:86E385AC28689C02C6D24963684FFD3F65D161CE ark:/67375/WNG-86PVDXNK-C |
ISSN: | 1862-6300 1862-6319 |
DOI: | 10.1002/pssa.200566110 |