Time-domain study on reproducibility of laser-based soft-error simulation

Studied is the soft error issue, which is a circuit malfunction caused by ion-radiation-induced noise currents. We have developed a laser-based soft-error simulation system to emulate the noise and evaluate its reproducibility in the time domain. It is found that this system, which utilizes a two-ph...

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Bibliographic Details
Published in:	Japanese Journal of Applied Physics Vol. 56; no. 4S; pp. 4 - 04CD16
Main Authors:	Itsuji, Hiroaki, Kobayashi, Daisuke, Lourenco, Nelson E., Hirose, Kazuyuki
Format:	Journal Article
Language:	English
Published:	The Japan Society of Applied Physics 01-04-2017
Subjects:	Absorption Lasers Noise Reproducibility Simulation Soft errors Time domain Transient current
Online Access:	Get full text
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Summary:	Studied is the soft error issue, which is a circuit malfunction caused by ion-radiation-induced noise currents. We have developed a laser-based soft-error simulation system to emulate the noise and evaluate its reproducibility in the time domain. It is found that this system, which utilizes a two-photon absorption process, can reproduce the shape of ion-induced transient currents, which are assumed to be induced from neutrons at the ground level. A technique used to extract the initial carrier structure inside the device is also presented.
Bibliography:	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23
ISSN:	0021-4922 1347-4065
DOI:	10.7567/JJAP.56.04CD16