Parameter extraction and electrical characterization of high density connector using time domain measurements

• Published in: IEEE transactions on advanced packaging Vol. 22; no. 1; pp. 32 - 39
• Main Authors: Pannala, S., Haridass, A., Swaminathan, M.
• Format: Journal Article
• Language: English
• Published: Piscataway, NY IEEE 01-02-1999; Institute of Electrical and Electronics Engineers
• Subjects: Algorithms; Applied sciences; Capacitance; Connectors; Coupling circuits; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics; Electronics; Equivalent circuits; Exact sciences and technology; Extraction; Inductance; Mutual coupling; Packaging; Parameter extraction; Parasitic capacitance; Pins; Reflectometry; Time domain; Time measurement; Connector; Digital system; Time domain method; Mutual capacity; High density; Crosstalk; High speed; Equivalent circuit; Differential mode; Common mode; Electrical characteristic; Parameter extraction
• ISSN: 1521-3323; 1557-9980
• DOI: 10.1109/6040.746540

Two coupled connector pins can be represented by an equivalent circuit consisting of six parameters, namely, self capacitance/self inductance per pin, mutual capacitance between pins and mutual inductance between pins. A systematic parameter extraction algorithm has been discussed in this paper using time domain reflectometry (TDR) measurements. This method uses a combination of stand-alone, common mode, and differential mode measurements to extract the connector parasitics. The accuracy of the equivalent circuit has been studied in detail using crosstalk measurements.