A 4-Mb toggle MRAM based on a novel bit and switching method

A 4-Mb magnetoresistive random access memory (MRAM) with a novel magnetic bit cell and toggle switching mode is presented. The circuit was designed in a five level metal, 0.18-mum complementary metal-oxide-semiconductor process with a bit cell size of 1.55 mum 2 . The new bit cell uses a balanced sy...

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Bibliographic Details
Published in:IEEE transactions on magnetics Vol. 41; no. 1; pp. 132 - 136
Main Authors: Engel, B.N., Akerman, J., Butcher, B., Dave, R.W., DeHerrera, M., Durlam, M., Grynkewich, G., Janesky, J., Pietambaram, S.V., Rizzo, N.D., Slaughter, J.M., Smith, K., Sun, J.J., Tehrani, S.
Format: Journal Article
Language:English
Published: New York, NY IEEE 01-01-2005
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:A 4-Mb magnetoresistive random access memory (MRAM) with a novel magnetic bit cell and toggle switching mode is presented. The circuit was designed in a five level metal, 0.18-mum complementary metal-oxide-semiconductor process with a bit cell size of 1.55 mum 2 . The new bit cell uses a balanced synthetic antiferromagnetic free layer and a phased write pulse sequence to provide robust switching performance with immunity from half-select disturbs. This switching mode greatly improves the operational performance of the MRAM as compared to conventional MRAM. A detailed description of this 4-Mb toggle MRAM is presented
Bibliography:ObjectType-Article-2
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ISSN:0018-9464
1941-0069
1941-0069
DOI:10.1109/TMAG.2004.840847