Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

Four pulsed-laser single-event effects systems, differing in wavelength and pulse width, were used to generate single event transients in a large-area silicon photodiode and an operational amplifier (LM124) to determine how transient amplitude and charge collection varied among the different systems...

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Bibliographic Details
Published in:	IEEE transactions on nuclear science Vol. 59; no. 4; pp. 988 - 998
Main Authors:	Buchner, S., Roche, N., Warner, J., McMorrow, D., Miller, F., Morand, S., Pouget, V., Larue, C., Ferlet-Cavrois, V., El Mamouni, F., Kettunen, H., Adell, P., Allen, G., Aveline, D.
Format:	Journal Article
Language:	English
Published:	New York IEEE 01-08-2012 The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers
Subjects:	Charge Collection Density Deviation Devices Electronics Engineering Sciences Heavy ions Laser beams Lasers Measurement by laser beam operational amplifier photodiode Photodiodes Pulse width pulsed laser Semiconductor lasers Shape single event transients Transient analysis wavelength Wavelengths
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