Thermal Design and Characterization of Transition-Edge Sensor (TES) Bolometers for Frequency-Domain Multiplexing
In contemporary cosmic microwave background experiments, bolometric detectors are often background limited, and in this case the sensitivity of instruments can only be improved by increasing the number of background-limited detectors, and so contemporary TES receivers contain as many pixels as possi...
Saved in:
Published in: | IEEE transactions on applied superconductivity Vol. 19; no. 3; pp. 496 - 500 |
---|---|
Main Authors: | , , , , , , , , , , , , |
Format: | Journal Article Conference Proceeding |
Language: | English |
Published: |
New York, NY
IEEE
01-06-2009
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | In contemporary cosmic microwave background experiments, bolometric detectors are often background limited, and in this case the sensitivity of instruments can only be improved by increasing the number of background-limited detectors, and so contemporary TES receivers contain as many pixels as possible. Frequency-domain multiplexing (fMUX) is one strategy for reading out many detectors with one SQUID. For any readout system, it is important to carefully evaluate the thermal design of detector, in conjunction with the readout bandwidth, in order to ensure stable electro-thermal feedback (ETF). We demonstrate a novel technique for characterizing the thermal circuit of our detectors, using am AC-bias and the fMUX electronics. This technique is used to study the internal thermal coupling of a TES bolometer. We illustrate how the insights gathered by this technique have been instrumental in improving the stability of our multiplexed detectors for the south pole telescope (SPT). |
---|---|
Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1051-8223 1558-2515 |
DOI: | 10.1109/TASC.2009.2018036 |