Influence on Cr and Ni doping on PbTe local structural properties
Structural aspects of Cr and Ni incorporation into the PbTe lattice are studied by means of Extended X-ray Absorption Fine Structure (EXAFS). EXAFS measurements enabled to get exact information on Pb and Te local structural features and their thermal evolution. The obtained results also revealed tha...
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Published in: | Journal of materials science. Materials in electronics Vol. 26; no. 12; pp. 10020 - 10026 |
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Main Authors: | , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
New York
Springer US
01-12-2015
Springer Nature B.V |
Subjects: | |
Online Access: | Get full text |
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