Influence on Cr and Ni doping on PbTe local structural properties
Structural aspects of Cr and Ni incorporation into the PbTe lattice are studied by means of Extended X-ray Absorption Fine Structure (EXAFS). EXAFS measurements enabled to get exact information on Pb and Te local structural features and their thermal evolution. The obtained results also revealed tha...
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Published in: | Journal of materials science. Materials in electronics Vol. 26; no. 12; pp. 10020 - 10026 |
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Main Authors: | , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
New York
Springer US
01-12-2015
Springer Nature B.V |
Subjects: | |
Online Access: | Get full text |
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Summary: | Structural aspects of Cr and Ni incorporation into the PbTe lattice are studied by means of Extended X-ray Absorption Fine Structure (EXAFS). EXAFS measurements enabled to get exact information on Pb and Te local structural features and their thermal evolution. The obtained results also revealed that by distorting their local environment, impurity atoms (Cr, Ni) add to high inherent disorder already present in the host PbTe. Larger anharmonicity of the Pb–Te bond and larger atomic thermal parameters observed in PbTe(Cr, Ni) could be of interest for thermoelectronics applications since they are both expected to reduce the thermal conductivity. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0957-4522 1573-482X |
DOI: | 10.1007/s10854-015-3682-z |