Low-frequency FM-noise-induced lineshape: a theoretical and experimental approach

• Published in: IEEE journal of quantum electronics Vol. 41; no. 4; pp. 549 - 553
• Main Authors: Tourrenc, J.-P., Signoret, P., Myara, M., Bellon, M., Perez, J.-P., Gosalbes, J.-M., Alabedra, R., Orsal, B.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01-04-2005; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Analytical solution; Autocorrelation; Autocorrelation functions; Delay; Electronics; Engineering Sciences; Exact sciences and technology; FM noise; Frequency; Fundamental areas of phenomenology (including applications); Laser noise; Lasers; lineshape prediction; Low-frequency noise; Mathematical analysis; Mathematical models; Noise; Noise measurement; Nonlinear optics; Optical interferometry; Optics; Photocurrent; Photoelectric effect; Physics; Quantum electronics; Semiconductor device noise; Semiconductor lasers; laser diodes; Signatures; Stimulated raman scattering; cars; Surface emitting lasers; Vertical cavity surface emitting lasers; vertical-cavity surface-emitting lasers (VCSELs); Autocorrelation function; Frequency modulation; lineshape prediction; Line widths; Photocurrents; Experimental device; 1/f noise; Experimental study; Laser beams; Heterodyne; FM noise; Vertical cavity laser; vertical-cavity surface-emitting lasers (VCSELs); Frequency modulation noise; Lasers; Surface emitting lasers; Analytical solution
• ISSN: 0018-9197; 1558-1713
• DOI: 10.1109/JQE.2005.843944

Linewidth determination by self-heterodyne or self-homodyne methods may lead to mistaken interpretation, because these measurements often include significant broadening due to low-frequency FM noise. The effects of FM noise on these linewidth measurement schemes are investigated. An analytical formulation of the photocurrent autocorrelation function is given for different frequency noise signatures, the lineshape being extracted from numerical implementation. We apply these results to linewidth prediction for 850-nm commercial vertical-cavity surface-emitting lasers and get almost perfect agreement between the theoretical and the experimental approaches.