A Zeroing Cell-to-Cell Interference Page Architecture With Temporary LSB Storing and Parallel MSB Program Scheme for MLC NAND Flash Memories
A new MLC NAND page architecture is presented as a breakthrough solution for sub-40-nm MLC NAND flash memories and beyond. To reduce cell-to-cell interference which is well known as the most critical scaling barrier for NAND flash memories, a novel page architecture including temporary LSB storing p...
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Published in: | IEEE journal of solid-state circuits Vol. 43; no. 4; pp. 919 - 928 |
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Main Authors: | , , , , , , , |
Format: | Journal Article Conference Proceeding |
Language: | English |
Published: |
New York, NY
IEEE
01-04-2008
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects: | |
Online Access: | Get full text |
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Summary: | A new MLC NAND page architecture is presented as a breakthrough solution for sub-40-nm MLC NAND flash memories and beyond. To reduce cell-to-cell interference which is well known as the most critical scaling barrier for NAND flash memories, a novel page architecture including temporary LSB storing program and parallel MSB program schemes is proposed. A BL voltage modulated ISPP scheme was used as parallel MSB programming in order to reduce cell-to-cell interference caused by the order in which the cells are programmed. By adopting the proposed page architecture, the number of neighbor cells that are programmed after programming a selected cell in BL direction as well as their amount of T/th shift during programming can be suppressed largely without increasing memory array size. Compared to conventional architecture it leads to a reduction of BL-BL cell-to-cell interference by almost 100%, and of WL-WL and diagonal cell-to-cell interferences by 50% at the 60 nm technology node. The proposed architecture enables also to improve average MLC program speed performance by 11% compared with conventional architecture, thanks to its fast LSB program performance. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0018-9200 1558-173X |
DOI: | 10.1109/JSSC.2008.917558 |