Development of a grain growth model for U3Si2 using experimental data, phase field simulation and molecular dynamics
The purpose of this work is to develop a model for normal grain growth in U3Si2. The average grain boundary energy was determined from previously published molecular dynamics simulations. The grain growth kinetics were quantified at various temperatures by annealing nanocrystalline samples. The mobi...
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Published in: | Journal of nuclear materials Vol. 532; no. C; p. 152069 |
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Abstract | The purpose of this work is to develop a model for normal grain growth in U3Si2. The average grain boundary energy was determined from previously published molecular dynamics simulations. The grain growth kinetics were quantified at various temperatures by annealing nanocrystalline samples. The mobility was determined by comparing phase field grain growth simulations to the experimental data. From these various methods, we found that the average grain size D in U3Si2 can be estimated over time t using the equation D2−D02=2αMγt, where D0 is the initial average grain size, the geometry factor α=0.96, the average grain boundary mobility M=6.30×10−18e−0.33[eV]kbTm4/(Js) with the Boltzmann constant kb and temperature T, and the average grain boundary energy has been found as a function of temperature, e.g. γ¯=0.83 J/m2 at 673 K.
•The grain growth constant and activation energy were obtained from isothermal annealing experiments on U3Si2 lamellae.•The grain growth geometric constant was calculated using several 3D phase field grain growth simulations.•The grain boundary mobility was determined from experimental data, grain boundary energy, and phase field simulations.•More grain growth occurs in U3Si2 than in UO2 at 1200 K.•Grain growth is more rapid in UO2 than in U3Si2 at their respective centerline temperatures. |
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AbstractList | The purpose of this work is to develop a model for normal grain growth in U3Si2. The average grain boundary energy was determined from previously published molecular dynamics simulations. The grain growth kinetics were quantified at various temperatures by annealing nanocrystalline samples. The mobility was determined by comparing phase field grain growth simulations to the experimental data. From these various methods, we found that the average grain size D in U3Si2 can be estimated over time t using the equation D2−D02=2αMγt, where D0 is the initial average grain size, the geometry factor α=0.96, the average grain boundary mobility M=6.30×10−18e−0.33[eV]/kbT m4/(Js) with the Boltzmann constant kb and temperature T, and the average grain boundary energy has been found as a function of temperature, e.g. γ¯=0.83 J/m2 at 673 K. The purpose of this work is to develop a model for normal grain growth in U3Si2. The average grain boundary energy was determined from previously published molecular dynamics simulations. The grain growth kinetics were quantified at various temperatures by annealing nanocrystalline samples. The mobility was determined by comparing phase field grain growth simulations to the experimental data. From these various methods, we found that the average grain size D in U3Si2 can be estimated over time t using the equation D2−D02=2αMγt, where D0 is the initial average grain size, the geometry factor α=0.96, the average grain boundary mobility M=6.30×10−18e−0.33[eV]kbTm4/(Js) with the Boltzmann constant kb and temperature T, and the average grain boundary energy has been found as a function of temperature, e.g. γ¯=0.83 J/m2 at 673 K. •The grain growth constant and activation energy were obtained from isothermal annealing experiments on U3Si2 lamellae.•The grain growth geometric constant was calculated using several 3D phase field grain growth simulations.•The grain boundary mobility was determined from experimental data, grain boundary energy, and phase field simulations.•More grain growth occurs in U3Si2 than in UO2 at 1200 K.•Grain growth is more rapid in UO2 than in U3Si2 at their respective centerline temperatures. |
ArticleNumber | 152069 |
Author | Beeler, Benjamin Lian, Jie Zhang, Yongfeng Gong, Bowen Cheniour, Amani Tonks, Michael R. He, Lingfeng Yao, Tiankai Harp, Jason M. |
Author_xml | – sequence: 1 givenname: Amani surname: Cheniour fullname: Cheniour, Amani organization: Department of Materials Science and Engineering, University of Florida, Gainesville, FL, 32611, USA – sequence: 2 givenname: Michael R. surname: Tonks fullname: Tonks, Michael R. email: michael.tonks@ufl.edu organization: Department of Materials Science and Engineering, University of Florida, Gainesville, FL, 32611, USA – sequence: 3 givenname: Bowen surname: Gong fullname: Gong, Bowen organization: Department of Mechanical, Aerospace and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY, 12180, USA – sequence: 4 givenname: Tiankai surname: Yao fullname: Yao, Tiankai organization: Idaho National Laboratory, Idaho Falls, ID, 83402, USA – sequence: 5 givenname: Lingfeng surname: He fullname: He, Lingfeng organization: Idaho National Laboratory, Idaho Falls, ID, 83402, USA – sequence: 6 givenname: Jason M. surname: Harp fullname: Harp, Jason M. organization: Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA – sequence: 7 givenname: Benjamin surname: Beeler fullname: Beeler, Benjamin organization: Department of Nuclear Engineering, North Carolina State University, Raleigh, NC, 27607, USA – sequence: 8 givenname: Yongfeng surname: Zhang fullname: Zhang, Yongfeng organization: Department of Engineering Physics, University of Wisconsin-Madison, Madison, WI, 53711, USA – sequence: 9 givenname: Jie surname: Lian fullname: Lian, Jie organization: Department of Mechanical, Aerospace and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY, 12180, USA |
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CitedBy_id | crossref_primary_10_1016_j_chphma_2021_12_001 crossref_primary_10_1016_j_net_2021_07_034 crossref_primary_10_1016_j_jnucmat_2021_153097 crossref_primary_10_3389_fmats_2021_627864 crossref_primary_10_1016_j_jnucmat_2023_154757 crossref_primary_10_1016_j_jnucmat_2020_152576 crossref_primary_10_1016_j_jnucmat_2020_152586 crossref_primary_10_1016_j_jnucmat_2021_153026 crossref_primary_10_1016_j_jnucmat_2023_154649 crossref_primary_10_1016_j_mtcomm_2024_108866 crossref_primary_10_1016_j_commatsci_2020_110104 crossref_primary_10_1016_j_commatsci_2020_110176 crossref_primary_10_1016_j_matdes_2022_110592 crossref_primary_10_3389_fenrg_2022_1080819 |
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Keywords | U3Si2 Grain boundary mobility Isothermal annealing experiments Grain growth Phase field |
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Snippet | The purpose of this work is to develop a model for normal grain growth in U3Si2. The average grain boundary energy was determined from previously published... |
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SubjectTerms | Computer simulation Experimental data Grain boundaries Grain boundary mobility Grain growth Grain size Growth kinetics Growth models Isothermal annealing experiments Mobility Molecular dynamics Particle size Phase field Temperature U3Si2 Uranium silicide |
Title | Development of a grain growth model for U3Si2 using experimental data, phase field simulation and molecular dynamics |
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